1. Homodyne full-field interferometer for measuring dynamic surface phenomena in microstructures
- Author
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Kimmo Kokkonen, Lauri Lipiäinen, and Matti Kaivola
- Subjects
Materials science ,02 engineering and technology ,Deformation (meteorology) ,Dynamic behavior ,01 natural sciences ,Signal ,Homodyne stabilized ,010309 optics ,Optics ,0103 physical sciences ,Time domain ,Electrical and Electronic Engineering ,ta214 ,Pixel ,business.industry ,Mechanical Engineering ,Resolution (electron density) ,021001 nanoscience & nanotechnology ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,Refresh rate ,Surface deformation ,Interferometry ,Full-field interferometry ,Temporal resolution ,Micromechanics ,0210 nano-technology ,business - Abstract
We describe a stabilized homodyne full-field interferometer capable of measuring vertical surface deformations of microstructures in the time domain. The interferometer is stabilized to a chosen operation point by obtaining a feedback signal from a non-moving, freely selectable, reference region on the sample surface. The stabilized full-field interferometer enables detection of time-dependent changes in the surface profile with nanometer scale vertical resolution, while the temporal resolution of the measurement is ultimately limited by the refresh rate of the camera only. The lateral resolution of the surface deformation is determined by the combination of the imaging optics together with the pixel size of the camera. The setup is used to measure the deformation of an Aluminum nitride membrane as a function of time-dependent pressure change. The data analysis allows for unambiguous determination of surface deformations over multiple fringes of the interferogram, hence enabling the study of a wide range of physical phenomena with varying magnitude of vertical surface movement.
- Published
- 2017
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