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Static magnetic filed was superimposed for surface tension measurement of molten silicon by oscillating droplet method using ElectroMagnetic Levitation (EML). Amplitude of surface oscillation of the m = 0, +/-1 and +/-2 was attenuated with increasing the static magnetic field from 0 to 0.3 T. When the static magnetic field was above 0.4 T, the surface oscillations of m = 0 and +/-1 vanished, whereas only the m = +/-2 oscillation remained at 0.4 - 0.8 T. The oscillation frequencies of m = 0 and +/-1 were increased with increasing static magnetic field, whereas that of m = +/-2 oscillation was constant at 0 - 0.3 T. Although the frequency of the m = +/-2 oscillation became a slightly small at 0.4 T, it kept constant again at 0.4 - 0.8 T. The calculated surface tension of molten silicon was influenced by the static magnetic field. Superimposition of static magnetic filed to EML is not equivalent to the microgravity experiment., 資料番号: AA0063706010

It is significant to measure surface tension and its temperature under microgravity in an ambient atmosphere with various oxygen partial pressures as a function of temperature, from the view point of both industry application and science of high temperature melts. Measurement will be carried out using the electromagnetic levitator on board the Gulfstream., 資料番号: AA0063706002

A static magnetic field up to 1.0 T was superimposed to silicon droplet levitated by electromagnetic force. The influences of the superimposition of the static magnetic field on the surface oscillation of the droplet were investigated. Surface oscillation of m = 0, +/- 1, and +/- 2 modes was attenuated vanishingly above 0.5 T. Although another oscillation like m = +/- 2 mode still remained under the static magnetic field from 0.5 to 0.8 T, an analysis of a deflection angle for the elliptically deformed droplet showed that it was due to the rotation., 資料番号: AA0063349038

An identification of frequencies of the m = +/-2 oscillation is required to measure an accurate surface tension of high temperature by the oscillating droplet technique using electromagnetic levitation. However, it is very difficult because the frequency peak of the m = 2 oscillation splits into two peaks in the frequency analysis if the droplet rotates. In this study, we clarified the influence of the droplet rotation on the m = +/-2 oscillation in the frequency analysis considering initial phase difference between m = +2 and m = -2., 資料番号: AA0063706009