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1. Interatomic Fe-Cr potential for modeling kinetics on Fe surfaces

2. Spherical Density Functional Theory

3. First-principles investigations of the magnetic phase diagram of Gd$_{1-x}$Ca$_{x}$MnO$_{3}$

4. Tuning the probability of defect formation via substrate strains in Sr$_2$FeMoO$_6$ films

8. Bridging the gap between surface physics and photonics

10. Quantitative description of short-range order and its influence on the electronic structure in Ag-Pd alloys

11. Effect of interstitial-driven lattice expansion on the stacking fault energy in austenitic steels

12. First-Principles prediction of the deformation modes in austenitic Fe-Cr-Ni alloys

13. Variation of magnetic properties of Sr$_2$FeMoO$_6$ due to oxygen vacancies

15. Initial oxidation of Fe-Al and Fe-Cr-Al alloys: Cr as an alumina booster

18. Surface Passivation of Germanium with ALD Al2O3: Impact of Composition and Crystallinity of GeOx Interlayer

20. Properties and modification of native oxides of InP(100)

26. Surface Passivation of Germanium with ALD Al 2 O 3 : Impact of Composition and Crystallinity of GeO x Interlayer.

28. Properties and modification of native oxides of InP(100).

32. Observation of Si 2p Core‐Level Shift in Si/High‐κ Dielectric Interfaces Containing a Negative Charge

33. Decreasing Interface Defect Densities via Silicon Oxide Passivation at Temperatures Below 450 °C

35. Observation of Crystalline Oxidized Silicon Phase

37. Oxidation-Induced Changes in the ALD-Al2O3/InAs(100) Interface and Control of the Changes for Device Processing

38. Decreasing Defect-State Density of Al2O3/GaxIn1-xAs Device Interfaces with InOx Structures

42. Decreasing Defect-State Density of Al2 O3 /Ga x In1− x As Device Interfaces with InO x Structures

43. Comparison of Chemical, Electronic, and Optical Properties of Mg-Doped AlGaN

46. Toward the Atomically Abrupt Interfaces of SiOx/Semiconductor Junctions

48. Kullback–Leibler and relative Fisher information as descriptors of locality.

49. Decreasing Defect-State Density of Al2O3/Ga xIn1− xAs Device Interfaces with InO x Structures.

50. Oxidation of the GaAs semiconductor at the Al2O3/GaAs junction

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