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5. Use of code error and beat frequency test method to identify single event upset sensitive circuits in a 1 GHz analog to digital converter

6. Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

7. The Effects of ELDRS at Ultra-Low Dose Rates

8. The Effects of ELDRS at Ultra-Low Dose Rates

17. Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates

21. Single Event Transient Hardness of a New Complementary (npn $+$ pnp) SiGe HBT Technology on Thick-Film SOI

23. The Effects of ELDRS at Ultra-Low Dose Rates

28. Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

34. Single Event Transient Hardness of a New Complementary (npn + pnp) SiGe HBT Technology on Thick-Film SOI.

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