27 results on '"Kuo, Ting-Tzu"'
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2. An Extended Method to Analyze Boron Diffusion Defects in 16 nm Node High-Voltage FinFETs
3. Improving Performance of FBARs by Advanced Low-Temperature High-Pressure Technology
4. Performance Improvement by Enhancing Passivation Layer of p-Type GaN High-Electron Mobility Transistors With Supercritical Oxygen Treatment
5. Investigation of Threshold Voltage and Drain Current Degradations in Si$_{\text{3}}$N$_{\text{4}}$/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation
6. Analysis of Breakdown-Voltage Increase on SiC Junction Barrier Schottky Diode Under Negative Bias Stress
7. Reliability Enhancement by Doping Boron and Fluorine in Lightly Doped Drain Region of High-Voltage FinFET
8. Abnormal On Current Tendency in Saturation Region between High and Light Carbon Doped buffer layer in p-GaN HEMT
9. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si3N4/AlGaN/GaN-HEMT
10. Analysis of the buffer trap-induced kink effect in AlGaN/GaN HEMT on SiC substrate
11. Analysis of abnormal threshold voltage shift induced by surface donor state in GaN HEMT on SiC substrate
12. Investigating two−stage degradation of threshold voltage induced by off−state stress in AlGaN/GaN HEMTs
13. Investigation of degradation mechanism after negative bias temperature stress in Si/SiGe channel metal-oxide-semiconductor capacitors induced by hydrogen diffusion
14. Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes
15. Analysis of Threshold Voltage Instability under Semi-ON Hot Electron Stress in AlGaN/GaN High Electron Mobility Transistor
16. A Comprehensive Negative Bias Temperature Instability Model for Gallium-nitride Metal-insulator-semiconductor High Electron Mobility Transistors From 77K to 393K
17. Investigation of degradation behavior under negative bias temperature stress in Si/Si0.8Ge0.2 metal-oxide-semiconductor capacitors
18. Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs
19. Investigation of Threshold Voltage and Drain Current Degradations in Si3N4/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation
20. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si 3 N 4 /AlGaN/GaN-HEMT.
21. Reliability enhancement in dipole-doped metal oxide semiconductor capacitor induced by low-temperature and high-pressure nitridation
22. Advanced Low-Temperature–High-Pressure Hydrogen Treatment for Interface Defect Passivation in Si- and SiGe-Channel MOSCAPs
23. Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process
24. Modified Conductance Method for The Extraction of Interface Traps in GaN Metal-Insulator-Semiconductor High Electron Mobility Transistors
25. Effect of deposition temperature on electrical properties of one-transistor-one-capacitor (1T1C) FeRAM devices
26. A Study of Effects of Metal Gate Composition on Performance in Advanced n-MOSFETs
27. Abnormal Positive Bias Temperature Instability induced by Dipole Doped N-type MOSCAP
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