Search

The present work preparation of thin films CdTe by vacuum thermal evaporation method. The X-ray diffraction shows all films were polycrystalline structure and the crystal size increases with increase thicknesses and decrease with annealing. Atomic force microscopic (AFM) image shows decrease the roughness with increase of thickness and annealing temperature. Scanning electron microscopic (SEM) image shows thin film thicknesses and annealing temperature effects directly on grain size, Moreover the optical band gap changed by increasing the thin films thickness and decreased with increasing of annealing temperature. [ABSTRACT FROM AUTHOR]