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This paper introduces OpenLS-DGF, an adaptive logic synthesis dataset generation framework, to enhance machine learning~(ML) applications within the logic synthesis process. Previous dataset generation flows were tailored for specific tasks or lacked integrated machine learning capabilities. While OpenLS-DGF supports various machine learning tasks by encapsulating the three fundamental steps of logic synthesis: Boolean representation, logic optimization, and technology mapping. It preserves the original information in both Verilog and machine-learning-friendly GraphML formats. The verilog files offer semi-customizable capabilities, enabling researchers to insert additional steps and incrementally refine the generated dataset. Furthermore, OpenLS-DGF includes an adaptive circuit engine that facilitates the final dataset management and downstream tasks. The generated OpenLS-D-v1 dataset comprises 46 combinational designs from established benchmarks, totaling over 966,000 Boolean circuits. OpenLS-D-v1 supports integrating new data features, making it more versatile for new challenges. This paper demonstrates the versatility of OpenLS-D-v1 through four distinct downstream tasks: circuit classification, circuit ranking, quality of results (QoR) prediction, and probability prediction. Each task is chosen to represent essential steps of logic synthesis, and the experimental results show the generated dataset from OpenLS-DGF achieves prominent diversity and applicability. The source code and datasets are available at https://github.com/Logic-Factory/ACE/blob/master/OpenLS-DGF/readme.md., Comment: 14 pages

Algorithm parallelization to leverage multi-core platforms for improving the efficiency of Electronic Design Automation~(EDA) tools plays a significant role in enhancing the scalability of Integrated Circuit (IC) designs. Logic optimization is a key process in the EDA design flow to reduce the area and depth of the circuit graph by finding logically equivalent graphs for substitution, which is typically time-consuming. To address these challenges, in this paper, we first analyze two types of conflicts that need to be handled in the parallelization framework of refactoring And-Inverter Graph~(AIG). We then present a fine-grained parallel AIG refactoring method, which strikes a balance between the degree of parallelism and the conflicts encountered during the refactoring operations. Experiment results show that our parallel refactor is 28x averagely faster than the sequential algorithm on large benchmark tests with 64 physical CPU cores, and has comparable optimization quality.

With the development of large-scale integrated circuits, electronic design automation~(EDA) tools are increasingly emphasizing efficiency, with parallel algorithms becoming a trend. The optimization of delay reduction is a crucial factor for ASIC technology mapping, and supergate technology proves to be an effective method for achieving this in EDA tools flow. However, we have observed that increasing the number of generated supergates can reduce delay, but this comes at the cost of an exponential increase in computation time. In this paper, we propose a parallel supergate computing method that addresses the tradeoff between time-consuming and delay optimization. The proposed method utilizes the input-constrained supergate pattern to parallelly generate the supergate candidates, and then filter the valid supergates as the results. Experiment results show the efficiency of the proposed method, for example, it can attain the improvement of 4x speedup in computation time and 10.1 in delay reduction with 32 threads.

Within the Electronic Design Automation (EDA) domain, AI-driven solutions have emerged as formidable tools, yet they typically augment rather than redefine existing methodologies. These solutions often repurpose deep learning models from other domains, such as vision, text, and graph analytics, applying them to circuit design without tailoring to the unique complexities of electronic circuits. Such an AI4EDA approach falls short of achieving a holistic design synthesis and understanding, overlooking the intricate interplay of electrical, logical, and physical facets of circuit data. This paper argues for a paradigm shift from AI4EDA towards AI-native EDA, integrating AI at the core of the design process. Pivotal to this vision is the development of a multimodal circuit representation learning technique, poised to provide a comprehensive understanding by harmonizing and extracting insights from varied data sources, such as functional specifications, RTL designs, circuit netlists, and physical layouts. We champion the creation of large circuit models (LCMs) that are inherently multimodal, crafted to decode and express the rich semantics and structures of circuit data, thus fostering more resilient, efficient, and inventive design methodologies. Embracing this AI-native philosophy, we foresee a trajectory that transcends the current innovation plateau in EDA, igniting a profound shift-left in electronic design methodology. The envisioned advancements herald not just an evolution of existing EDA tools but a revolution, giving rise to novel instruments of design tools that promise to radically enhance design productivity and inaugurate a new epoch where the optimization of circuit performance, power, and area (PPA) is achieved not incrementally, but through leaps that redefine the benchmarks of electronic systems' capabilities., Comment: The authors are ordered alphabetically. Contact: qxu@cse[dot]cuhk[dot]edu[dot]hk, gluo@pku[dot]edu[dot]cn, yuan.mingxuan@huawei[dot]com

Technology mapping is an essential step in EDA flow. However, the function of the circuit may be changed after technology mapping, and equivalence checking (EC) based verification is highly necessary. The traditional EC method has significant time and resource constraints, making it only feasible to carry out at a coarse-grained level. To make it efficient for technology mapping, we propose a fine-grained method called MEC, which leverages a combination of two approaches to significantly reduce the time cost of verification. The local block verification approach performs fast verification and the global graph cover approach guarantees correctness. The proposed method is rigorously tested and compared to three EC tools, and the results show that MEC technique offers a substantial improvement in speed. MEC not only offers a faster and more efficient way of performing EC on technology mapping but also opens up new opportunities for more fine-grained verification in the future., Comment: International Symposium of EDA 2023

Open-source EDA shows promising potential in unleashing EDA innovation and lowering the cost of chip design. This paper presents an open-source EDA project, iEDA, aiming for building a basic infrastructure for EDA technology evolution and closing the industrial-academic gap in the EDA area. iEDA now covers the whole flow of physical design (including Floorplan, Placement, CTS, Routing, Timing Optimization etc.), and part of the analysis tools (Static Timing Analysis and Power Analysis). To demonstrate the effectiveness of iEDA, we implement and tape out three chips of different scales (from 700k to 1.5M gates) on different process nodes (110nm and 28nm) with iEDA. iEDA is publicly available from the project home page http://ieda.oscc.cc.

Landslide is a natural disaster that can easily threaten local ecology, people's lives and property. In this paper, we conduct modelling research on real unidirectional surface displacement data of recent landslides in the research area and propose a time series prediction framework named VMD-SegSigmoid-XGBoost-ClusterLSTM (VSXC-LSTM) based on variational mode decomposition, which can predict the landslide surface displacement more accurately. The model performs well on the test set. Except for the random item subsequence that is hard to fit, the root mean square error (RMSE) and the mean absolute percentage error (MAPE) of the trend item subsequence and the periodic item subsequence are both less than 0.1, and the RMSE is as low as 0.006 for the periodic item prediction module based on XGBoost\footnote{Accepted in ICANN2023}.

There are two fundamental problems in applying deep learning/machine learning methods to disease classification tasks, one is the insufficient number and poor quality of training samples; another one is how to effectively fuse multiple source features and thus train robust classification models. To address these problems, inspired by the process of human learning knowledge, we propose the Feature-aware Fusion Correlation Neural Network (FaFCNN), which introduces a feature-aware interaction module and a feature alignment module based on domain adversarial learning. This is a general framework for disease classification, and FaFCNN improves the way existing methods obtain sample correlation features. The experimental results show that training using augmented features obtained by pre-training gradient boosting decision tree yields more performance gains than random-forest based methods. On the low-quality dataset with a large amount of missing data in our setup, FaFCNN obtains a consistently optimal performance compared to competitive baselines. In addition, extensive experiments demonstrate the robustness of the proposed method and the effectiveness of each component of the model\footnote{Accepted in IEEE SMC2023}.

For modern IC design, electromagnetic coupling among interconnect wires plays an increasingly important role in signoff analysis. The requirement of fast and accurate capacitance extraction is becoming more and more urgent.The critical step of extracting capacitance among interconnect wires is solving electric field. However, due to the high computational complexity, solving electric field is extreme timing-consuming. To improve computational efficiency, we propose a Galerkin boundary element method (GBEM) to extract capacitance. The advantage of this method is that it can greatly reduce the number of boundary elements on the premise of ensuring that the error is small enough. As a consequence, the matrix order of the discretization equation will also decrease. The experiments in this paper have proved this advantage of our algorithm. Moreover, we have took advantage of some mathematical theorems in this paper. Our attempt shows that there will be more connections between the capacitance extraction and some mathematical conception so that we can use more mathematical tools to solve the problems of capacitance extraction.