136 results on '"Liu, Fanyu"'
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2. Analysis of anomalous C-V behavior for extracting the traps density in the undoped polysilicon with a double-BOX structure
3. Band alignment and charge transfer mechanisms in the prediction of advanced gate dielectrics for carbon nanotube field-effect transistors
4. C-V characterization of the trap-rich layer in a novel Double-BOX structure
5. Radiation hardness evaluation of ε-Ga2O3 thin-film devices under swift heavy ion irradiation
6. Study on the influence mechanism of flue gas desulphurisation gypsum on solid waste-based geopolymer grouting materials
7. C-V measurement and modeling of double-BOX Trap-Rich SOI substrate
8. The impact of terminating cost-sharing reductions payments on health insurance plan choices
9. Effects of soluble Antarctic krill protein-curcumin complex combined with photodynamic inactivation on the storage quality of shrimp
10. Swift heavy ion irradiation-driven energy band engineering and its profound influence on the photoresponse of β-Ga2O3 ultraviolet photodetectors
11. Mitigation of Single-Event Upset Sensitivity for 6T SRAM in a 0.18 μm DSOI Technology Considering High LET Heavy Ions Irradiation
12. Impact of Back-Gate Bias and Body-Tie on the DSOI SRAMs Under Total Ionizing Dose Irradiation
13. A New Compact Z$^{\text{2}}$-FET Model Based on Artificial Neural Network and Its Applications
14. A Novel NH3 Sensing Mechanism Based on Au Pads Activated Schottky Barrier MOSFET on Silicon-on-Insulator with Extremely High Sensitivity at Room Temperature
15. Layout-based mitigation of single-event transient for monolithic 3D CMOS integrated circuits
16. Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
17. Swift heavy ion irradiation-driven energy band engineering and its profound influence on the photoresponse of β-Ga2O3 ultraviolet photodetectors.
18. Radiation hardness evaluation of ε-Ga2O3 thin-film devices under swift heavy ion irradiation
19. Nano-scaled transistor reliability characterization at nano-second regime
20. Research Progress on Properties of Basic Electrolyzed Water and Its Application in Food.
21. Performance Evaluation of Plastic Optical Fiber Communication Using PAM4 and Computational Temporal Ghost Imaging Algorithm
22. On the Ion Line Calibration by Plasma Line in ISR Measurements
23. The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology
24. A New Compact Z2-FET Model Based on Artificial Neural Network and Its Applications
25. Robustness-Improved ESD Protection Devices With Low Leakage Using Middle Silicon Layer in Double SOI Technology
26. A Novel NH3 Sensing Mechanism Based on Au Pads Activated Schottky Barrier MOSFET on Silicon-on-Insulator With Extremely High Sensitivity at Room Temperature
27. Back-gate effects and mobility characterization in junctionless transistor
28. A Compact Artificial Spiking Neuron Using a Sharp-Switching FET With Ultra-Low Energy Consumption Down to 0.45 fJ/Spike
29. The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology
30. Computational temporal ghost imaging algorithm for PAM4-based optical communication systems
31. Enhanced Spatial Light Coupling Efficiency of Polymer Optical Fiber via Micro-lens Self-heating Melting Technique
32. Ultra-High-Energy Heavy Ion Induced Single Event Effect of TSV-Based 3D Integrated SOI SRAM Circuits
33. High Gain Pseudo-Inverter Based on Silicon-on-Insulator With Ambipolar Transport
34. Development of the Sanya Incoherent Scatter Radar and Preliminary Results
35. Novel SOI Based Pseudo-Inverter: Experimental and Simulation Research
36. Enhanced coupling effects in vertical double-gate FinFETs
37. Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology
38. Reliability Improvement on SRAM Physical Unclonable Function (PUF) Using an 8T Cell in 28 nm FDSOI
39. Comparison of Total Ionizing Dose Effects in SOI FinFETs Between Room and High Temperature
40. Extraction of Interface-Trap Densities of the Stacked Bonding Structure in 3D Integration Using High-Frequency Capacitance-Voltage Technique
41. Total Ionizing Dose Radiation Effects Hardening Using Back-gate Bias in Double-SOI Structure
42. A highly sensitive optical fiber temperature sensor based on the enhanced Vernier effect
43. Dependence of Temperature and Back-Gate Bias on Single-Event Upset Induced by Heavy Ion in 0.2-μm DSOI CMOS Technology
44. A Brief Guide For Qualified Certification Documents Of The Right Of Representative In A Chinese Trademark Litigations-US Companies (Delaware)
45. Simulation of Synergetic Radiation Effects for P-type bulk VDMOS
46. Aldo-Keto Reductase 1C3 Mediates Chemotherapy Resistance in Esophageal Adenocarcinoma via ROS Detoxification
47. Method for controlling temperature sensitivity of the fiber intermodal sensor and its application in the torsion sensor
48. Single event transient pulse attenuation effect in three-transistor inverter chain
49. Modeling to predict the time evolution of negative bias temperature instability (NBTI) induced single event transient pulse broadening
50. The effect of P+ deep well doping on SET pulse propagation
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