5 results on '"Luo, Tseng-Chin"'
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2. Mask versus Schematic - an enhanced design-verification flow for first silicon success
3. A novel array-based test methodology for local process variation monitoring
4. Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process Characterization.
5. A Novel Design Flow for Dummy Fill Using Boolean Mask Operations.
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