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We report polarization dependent photoluminescence studies on unintentionally-, Mg-, and Ca-doped β-Ga2O3 bulk crystals grown by the Czochralski method. In particular, we observe a wavelength shift of the highest-energy UV emission which is dependent on the pump photon energy and polarization. For 240 nm (5.17 eV) excitation almost no shift of the UV emission is observed between E||b and E||c, while a shift of the UV emission centroid is clearly observed for 266 nm (4.66 eV), a photon energy lying between the band absorption onsets for the two polarizations. These results are consistent with UV emission originating from transitions between conduction band electrons and two differentially-populated self-trapped hole (STH) states. Calcuations based on hybrid and self-interaction-corrected density functional theories further validate that the polarization dependence is consistent with the relative stability of two STHs. This observation implies that the STHs form primarily at the oxygen atoms involved in the original photon absorption event, thus providing the connection between incident polarization and emission wavelength. The data imposes a lower bound on the energy separation between the self-trapped hole states of ~70-160 meV, which is supported by the calculations.

In this study, the formation and character of gallium vacancies (VGa) and their complexes in near surface and bulk regions of single crystal β-Ga2O3 were explored using unintentionally doped single crystals grown by the Czochralski method. As-grown and O2 annealed (up to 1550 °C) samples were investigated using positron annihilation spectroscopy (PAS) to study the top 0.05–6 μm, and also current–voltage measurements and infrared (IR) spectroscopy, with hydrogenated samples to probe VGa, to study the bulk. After annealing in O2 > 1000 °C, the β-Ga2O3 resistivity begins increasing, up to ∼109 Ω cm for 1550 °C treatment, with the top 0.5 mm being many orders of magnitude more resistive. PAS measurements of the top 6 μm (S values) and very near surface 200 nm (diffusion length, L) indicate differential behavior as a function of peak annealing temperature. At least four temperature regimes of behavior are described. VGa are present in the bulk after growth, but considerable changes occur upon annealing at a temperature ≈1000 °C, where L and S decrease simultaneously, suggesting an increasing defect concentration (L) but a decreasing defect volume (S). Annealing at a temperature ≈1400 °C increases S again, showing an increasing volume concentration of VGa, with IR absorption showing a large signature of VGa-2H, indicative of increased VGa formation that was not present when annealing at a temperature ≈1000 °C. These results suggest that defect changes from annealing in oxygen are depth dependent, and that VGa configuration may not be the same near the oxygen-exposed surface of the sample and in the bulk. [ABSTRACT FROM AUTHOR]

Gallium oxide is a promising semiconductor for its potential as a material in the field of power electronics. The effects of iridium impurities on undoped, Mg-doped, and Ca-doped gallium oxides were investigated with IR spectroscopy. In undoped and Ca-doped β-Ga2O3, IR peaks at 3313, 3450, and 3500 cm−1 are tentatively assigned to O–H bond-stretching modes of IrH complexes. Mg-, Ca-, and Fe-doped samples show an Ir4+ electronic transition feature at 5148 cm−1. By measuring the strength of this feature vs photoexcitation, the Ir3+/4+ donor level was determined to lie 2.2–2.3 eV below the conduction band minimum. Ga2O3:Mg also has a range of sidebands between 5100 and 5200 cm−1, attributed to IrMg pairs. Polarized IR measurements show that the 5248 cm−1 peak is anisotropic, weakest for light polarized along the c axis, consistent with Lenyk et al. [J. Appl. Phys. 125, 045703 (2019)]. [ABSTRACT FROM AUTHOR]

Bulk undoped ZnS materials exhibit relatively bright yet diverse luminescence behavior, which has, in recent years, been attributed to intrinsic defects. However, the luminescence also resembles that of doped materials, implying a role of impurities. Luminescence features have also been attributed to oxygen impurities causing defect clusters or energy band anti-crossing. Thus, this study couples optical and electrical techniques, such as band edge transmission, photoluminescence (PL), PL excitation, radioluminescence, thermoluminescence, optical deep level transient spectroscopy, and photoinduced current transient spectroscopy, to explore the identity of defect levels. ZnS materials studied are commercial single crystals made by physical vapor transport, high-pressure Bridgman, and powder processing. These undoped bulk ZnS exhibit luminescence behavior similar to that of reported doped ZnS powders (10−4 to 10−2 mol. % doping for luminescent materials). Dopants (such as Al, Cl, Cu, and Ag) are also commonly found impurities in ZnS; hence, it is reasonable to believe they have a role in the luminescence of nominally undoped ZnS. By comparing the variation in optical and electrical properties between samples to the processing method and the rich literature on intentionally doped ZnS, this study shows a possible dominant contribution of impurities and impurity-containing defects on the luminescence of bulk "undoped" ZnS. Hence, there is no need to resort to complex mechanisms to explain the luminescence, but rather the metal and halide impurities and their defect complexes determine the main characteristics of luminescence in this wide-bandgap semiconductor. [ABSTRACT FROM AUTHOR]

Cadmium telluride (CdTe) high purity, bulk, crystal ingots doped with phosphorus were grown by the vertical Bridgman melt growth technique to understand and improve dopant solubility and activation. Large net carrier densities have been reproducibly obtained from as-grown ingots, indicating successful incorporation of dopants into the lattice. However, net carrier density values are orders of magnitude lower than the solubility of P in CdTe as reported in literature, 1018/cm3 to 1019/cm3 [J. H. Greenberg, J. Cryst. Growth 161, 1–11 (1996) and R. B. Hall and H. H. Woodbury, J. Appl. Phys. 39(12), 5361–5365 (1968)], despite comparable starting charge dopant densities. Growth conditions, such as melt stoichiometry and post growth cooling, are shown to have significant impacts on dopant solubility. This study demonstrates that a significant portion of the dopant becomes incorporated into second phase defects as compounds of cadmium and phosphorous, such as cadmium phosphide, which inhibits dopant incorporation into the lattice and limits maximum attainable net carrier density in bulk crystals. Here, we present an extensive study on the characteristics of these second phase defects in relation to their composition and formation kinetics while providing a pathway to minimize their formation and enhance solubility. [ABSTRACT FROM AUTHOR]

We applied time-resolved pump-probe spectroscopy based on free carrier absorption and light diffraction on a transient grating for direct measurements of the carrier lifetime and diffusion coefficient D in high-resistivity single crystal CdTe (codoped with In and Er). The bulk carrier lifetime τ decreased from 670 ± 50 ns to 60 ± 10 ns with increase of excess carrier density N from 1016 to 5 x 1018 cm-3 due to the excitation-dependent radiative recombination rate. In this N range, the carrier diffusion length dropped from 14 µm to 6 µm due to lifetime decrease. Modeling of in-depth (axial) and in-plane (lateral) carrier diffusion provided the value of surface recombination velocity S = 6 x 105 cm/s for the untreated surface. At even higher excitations, in the 1019-3 x 1020 cm-3 density range, D increase from 5 to 20 cm²/s due to carrier degeneracy was observed. [ABSTRACT FROM AUTHOR]

The use of state-of-the-art microelectronic devices in space radiation environments faces new challenges with the adoption of low dielectric constant (low-k) materials as inter-level dielectrics. This is demonstrated in a preliminary study of methyl-silsesquioxane low-k films. We report radiation damage, induced by a 2-keV low- current-density (~2 x [10.sup.6] [s.sup.-1] [cm.sup.-2]) positron beam, and observed by positron annihilation spectroscopy. Index Terms--Dielectric, electron radiation, ionizing radiation, low dielectric constant (low-k), polymer.

Research was conducted to examine low dielectric constant (low-k) hydrogen-silsesquioxane (HSSQ) thin films using Doppler broadening positron annihilation spectroscopy. Changes in the local electronic environment in a thin film were observed via the high void sensitivity of the method in combination with depth-resolving capability. Results suggest a complex relationship between the film dielectric constant and pore size and pore density.

Zinc oxide (ZnO) is a wide band gap semiconductor and a potential candidate for next generation white solid state lighting applications. In this work, hydrogen-related complexes in lithium diffused ZnO single crystals were studied. In addition to the well-known Li-OH complex, several other hydrogen defects were observed. When a mixture of Li2O and ZnO is used as the dopant source, zinc vacancies are suppressed and the bulk Li concentration is very high (>1019cm-3). In that case, the predominant hydrogen complex has a vibrational frequency of 3677 cm-1, attributed to surface O-H species. When Li2CO3 is used, a structured blue luminescence band and O-H mode at 3327 cm-1 are observed at 10K. These observations, along with positron annihilation measurements, suggest a zinc vacancy–hydrogen complex, with an acceptor level ∼0.3 eV above the valence-band maximum. This relatively shallow acceptor could be beneficial for p-type ZnO. [ABSTRACT FROM AUTHOR]