1. Radiative recombination properties of near-stoichiometric CuInSe2 thin films
- Author
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Helena Stange, Marc-Daniel Heinemann, Dieter Greiner, Sergiu Levcenko, Roland Mainz, Léo Choubrac, and Thomas Unold
- Subjects
Materials science ,Photoluminescence ,Yield (engineering) ,Physics and Astronomy (miscellaneous) ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Crystallographic defect ,Molecular physics ,Spectral line ,symbols.namesake ,0103 physical sciences ,symbols ,General Materials Science ,Spontaneous emission ,Thin film ,010306 general physics ,0210 nano-technology ,Stoichiometry ,Raman scattering - Abstract
The properties of electronic defects and their relation to structural defects are of high relevance for $\mathrm{CuInS}{\mathrm{e}}_{2}$ photovoltaic absorbers. Here, we use Raman scattering and steady-state photoluminescence to study the intrinsic optoelectronic properties of near-stoichiometric $\mathrm{CuInS}{\mathrm{e}}_{2}$ samples with a lateral composition gradient around the Cu saturation point. Apart from a well-known shallow defect band at 0.97 eV, we also observe a deep defect band at 0.8 eV, which is not discernable in photoluminescence spectra at lower temperatures. The preparation of a laterally graded sample with a very precise relative composition range by in situ process control allows for a measurement of a significant decrease of the photoluminescence emission yield at the Cu-poor/Cu-rich transition on a very narrow composition scale. Possible assignments of the bands to structural point defects are discussed.
- Published
- 2020
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