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The semicircular canal (SC) system of the inner ear detects head angular accelerations and is essential for navigation and spatial awareness in vertebrates. Because the bony labyrinth encloses the membranous labyrinth SCs, it can be used as a proxy for animal behavior. The bony labyrinth of dicynodonts, a clade of herbivorous non-mammalian synapsids, has only been described in a handful of individuals and remains particularly obscure. Here we describe the bony labyrinth anatomy of three Endothiodon cf. bathystoma specimens from Mozambique based on digital reconstructions from propagation phase-contrast synchrotron micro-computed tomography. We compare these findings with the bony labyrinth anatomy of their close relative Niassodon. The bony labyrinths of Endothiodon and Niassodon are relatively similar and show only differences in the shape of the horizontal SCs and the orientation of the vertical SCs. When compared to extant mammals, Endothiodon and Niassodon have highly eccentric SCs. In addition, the Endothiodon SCs are nearly orthogonal. An eccentric and orthogonal SC morphology is consistent with a specialization in rapid head movements, which are typical of foraging or feeding behaviors. Furthermore, we estimate the body mass of these Endothiodon specimens at ~116 to 182 kg, based on the average SC radii calculated using a linear regression model optimized by the Amemiya Prediction Criterion. Our findings provide novel insights into the paleobiology of Endothiodon which are consistent with the peculiar feeding mechanism among dicynodonts presumed from their multiple postcanine toothrows.

It is essential to identify and control the preferential orientation of Ni-Ti shape memory alloy (SMA) films since it is a crucial factor in determining the shape memory behavior. In the present work, in situ studies by synchrotron radiation scattering enabled to identify the different steps of the structural evolution of Ni-Ti films during co-sputtering deposition. For micro-electromechanical systems (MEMS) integration, there is a need for an electrically and thermally insulating or sacrificial layer. Widening the scope of previous experiments concerning the influence of the deposition parameters on the structure of the Ni-Ti films, the incorporation of a TiN buffer layer has been tested. Here, it is established a relationship between the TiN substrates and Ni-Ti texture development (B2 phase). Ni-Ti films mainly containing grains with (110) or (211) planes of the B2 phase parallel to the film surface could be produced using TiN buffer layers with distinct thickness values. The electrical resistivity measurements performed during temperature cycling have shown that the crystallographic orientations of the Ni-Ti films influence their phase transformation characteristics. The resistivity increase during R-phase transformation, especially visible on cooling, is higher for Ni-Ti films with a higher fraction of grains of the B2 phase with (211) parallel to the film surface.

The possibilities of in-situ X-ray investigations at ROBL for the study of thin films growth are summarized.