1. Measurement of nanometer electron beam sizes with laser interference using Shintake Monitor
- Author
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Toshiaki Tauchi, Toshiyuki Okugi, Nobuhiro Terunuma, Sachio Komamiya, Junji Urakawa, Jacqueline Yan, Yoshio Kamiya, Masahiro Oroku, Yohei Yamaguchi, and Kiyoshi Kubo
- Subjects
Physics ,Nuclear and High Energy Physics ,Photon ,Interaction point ,business.industry ,Laser ,law.invention ,Amplitude modulation ,Optics ,Modulation ,law ,Cathode ray ,business ,Accelerator Test Facility ,Instrumentation ,Beam (structure) - Abstract
The Shintake Monitor is an essential beam tuning device installed at the interaction point (IP) of ATF2 [1] , the final focus test beam line of the Accelerator Test Facility (ATF) to measure its nanometer order vertical e − beam sizes ( σ y ⁎ ). The e − beam collides with a target of laser interference fringes, and σ y ⁎ is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. By switching between several laser crossing angle modes, it is designed to accommodate a wide range of σ y ⁎ from 20 nm to a few micrometers with better than 10% accuracy. Owing to this ingenious technique, Shintake Monitor 1 [2] , [3] is the only existing device capable of measuring σ y ⁎ σ y ⁎ down to the design value of 37 nm. Shintake Monitor has demonstrated stable σ y ⁎ measurement with 5–10% stability. Major improvements in hardware and measurement schemes contributed to the suppression of error sources. This paper describes the design concepts and beam time performance of Shintake Monitor, as well as an extensive study of systematic errors with the aim of precisely extracting σ y ⁎ from the measured modulation.
- Published
- 2014
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