1. X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices.
- Author
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Caha, O., Křápek, V., Holý, V., Moss, S. C., Li, J. H., Norman, A. G., Mascarenhas, A., Reno, J. L., Stangl, J., and Medunña, M.
- Subjects
SUPERLATTICES ,X-ray diffraction ,INTERFACES (Physical sciences) ,MATHEMATICAL continuum ,SURFACES (Technology) ,PHYSICAL & theoretical chemistry - Abstract
Lateral composition modulation in InAs/AlAs short-period superlattices was investigated by x-ray grazing-incidence diffraction and coplanar x-ray diffraction at a “normal” wavelength and at an anomalous wavelength, for which diffraction from the (200) planes does not exhibit a chemical contrast. The experimental data were compared with theoretical simulations assuming that the interfaces consist of a periodic sequence of monoatomic steps. The displacement field in the superlattice was calculated by continuum elasticity and using a valence-force field method. From the fit of the experimental data to the theory, the lengths of individual atomic terraces were determined. [ABSTRACT FROM AUTHOR]
- Published
- 2004
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