1. ID20 – opportunities for inelastic X-ray scattering at extreme conditions
- Author
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Sahle, C, Petitgirard, S, Spiekermann, G, Sakrowski, R, Suomalainen, N, Gerbon, F, Jacobs, J, Watier, Y, Sternemann, C, Moretti Sala, M, Cerantola, V, Sahle, Christoph J., Petitgirard, Sylvain, Spiekermann, Georg, Sakrowski, Robin, Suomalainen, Noora, Gerbon, Florent, Jacobs, Jeroen, Watier, Yves, Sternemann, Christian, Moretti Sala, Marco, Cerantola, Valerio, Sahle, C, Petitgirard, S, Spiekermann, G, Sakrowski, R, Suomalainen, N, Gerbon, F, Jacobs, J, Watier, Y, Sternemann, C, Moretti Sala, M, Cerantola, V, Sahle, Christoph J., Petitgirard, Sylvain, Spiekermann, Georg, Sakrowski, Robin, Suomalainen, Noora, Gerbon, Florent, Jacobs, Jeroen, Watier, Yves, Sternemann, Christian, Moretti Sala, Marco, and Cerantola, Valerio
- Abstract
Owing to the availability of bright X-rays sources such as the ESRF-EBS, inelastic X-ray scattering of samples contained in complex sample environments, including high pressure devices, has become feasible. Compared to well-established characterization techniques such as X-ray diffraction or X-ray absorption fine structure spectroscopy, inelastic X-ray scattering of samples under extreme conditions is a relatively novel probe. However, unique information about the electronic, magnetic, and local atomic structure is accessible with inelastic X-ray scattering. Here, capabilities of beamline ID20 of the ESRF in the field of high pressure inelastic X-ray scattering are presented and some recent activities are reviewed.
- Published
- 2024