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We report on the structural and optical properties of heteroepitaxial II–VI CdTe (211)B buffer layers with strained CdZnTe/CdTe superlattice layers, investigated by employing non-destructive methods including high-resolution x-ray diffraction, cathodoluminescence, and photoluminescence spectroscopy. X-ray diffraction reciprocal space mapping measurements revealed that the superlattice layers are coherently strained, leading to a spread in x-ray double-crystal rocking curve full-width at half-maximum values but better in-plane lattice-matching with HgCdTe. Both cross-sectional cathodoluminescence and photoluminescence measurements confirm the coherent growth of superlattice layers and their dislocation filtering effects. Both these techniques in CdTe layers are found to be well correlated with the dislocation density as determined by etch pit density measurements. The results indicate the potential of these non-destructive methods to be further developed into general-purpose techniques capable of characterizing the defect evolution in semiconductor heteroepitaxy. [ABSTRACT FROM AUTHOR]

Devices with volatile memristive switching and self‐sustained relaxation oscillations have received significant attention for their use in neuromorphic computing and solving optimization problems. However, obtaining devices with stable response and reliable oscillation remains challenging. This work describes the utility of metal/oxide interlayers in achieving reliable device performance with tuneable characteristics using Nb‐Nb2O5‐Pt structures. Detailed physical characterization of the Nb/Nb2O5 interlayer region shows that it consists of a thin, near‐stoichiometric Nb2O5 and an NbOx layer with a graded oxygen content. The impact of these interlayers on device performance is assessed by investigating their switching characteristics and oscillation dynamics. It is shown that the presence of the interlayer has a direct impact on the memristive switching mode and parameters threshold switching characteristics parameters. These dependencies are explained with reference to a lumped‐element circuit model of the device and shown to be dominated by changes in device resistance caused by interlayer formation. Significantly, stable oscillation with tuneable frequency is obtained by increasing the thickness of the reactive Nb electrode. Then, by simulating an array of coupled oscillators, a unique Hamiltonian solver is demonstrated. These results provide pathways for optimizing volatile memristive switching characteristics and guidance on how such devices can be employed to solve combinatorial optimization problems. [ABSTRACT FROM AUTHOR]

A simple means of detecting and spatially mapping volatile and nonvolatile conductive filaments in metal/oxide/metal cross-point devices is introduced, and its application demonstrated. The technique is based on thermal discolouration of a thin photoresist layer deposited on the top electrode (TE) of the cross-point device and relies on the increase in temperature produced by local Joule heating of an underlying conductive filament. Finite element modelling of the temperature distribution and its dependencies shows that the maximum temperature at the TE/photoresist interface is particularly sensitive to the TE thickness. The technique is demonstrated on NbOx-based metal-oxide-metal cross-point devices with a 25 nm thick top (Pt) electrode, where it is used to undertake a statistical analysis of the filament location as a function of device area. This shows that filament formation is heterogeneous; the majority of filaments form preferentially along the TE edge, and the fraction of these increases with the decreasing device area. Transmission electron microscopy of the top and bottom electrode edges is used to explain this observation and suggests that it is due to a reduction in the effective oxide thickness in this region. [ABSTRACT FROM AUTHOR]

The ever-present demand for high-performance HgCdTe infrared detectors with larger array size and lower cost than currently available technologies based on lattice-matched CdZnTe (211)B substrates has fuelled research into heteroepitaxial growth of HgCdTe and CdTe buffer layers on lattice-mismatched alternative substrates with a (211)B orientation. Driven by the large lattice mismatch, the heteroepitaxial growth of (Hg)CdTe can result in (133)B-orientated material, which, however, has been less explored in comparison to (211)B-oriented growth. Herein, we report on the structural properties of heteroepitaxially grown single-crystal II–VI CdTe (133)B-oriented buffer layers on III–V GaAs (211)B substrates. Azimuthal-dependent x-ray double-crystal rocking curve measurements for the CdTe buffer layers show that the full-width at half-maximum value obtained along the GaAs [ 1 ¯ 11 ] direction is narrower than that obtained along the GaAs [ 01 1 ¯ ] direction, which is presumably related to the in-plane anisotropic structural characteristics of the grown CdTe layers. By incorporating strained CdZnTe/CdTe superlattice-based dislocation filtering layers (DFLs), a significant improvement in material quality has been achieved in (133)B-orientated CdTe buffer layers, including a reduced etch pit density in the low-105 cm−2 range and improved surface roughness. These results indicate that the CdTe (133)B DFL buffer layer process is a feasible approach for growing high-quality CdTe and HgCdTe materials on large-area, low-cost alternative substrates. [ABSTRACT FROM AUTHOR]

Devices exploiting negative differential resistance (NDR) are of particular interest for analog computing applications, including oscillator‐based neural networks. These devices typically exploit the continuous S‐shaped current–voltage characteristic produced by materials with a strong temperature‐dependent electrical conductivity, but recent studies have also highlighted the existence of a second, discontinuous (snap‐back) characteristic that has the potential to provide additional functionality. The development of devices based on this characteristic is currently limited by uncertainty over the underlying physical mechanism, which remains the subject of active debate. In situ thermoreflectance imaging and a simple model are used to finally resolve this issue. Specifically, it is shown that the snap‐back response is a direct consequence of current localization and redistribution within the oxide film, and that material and device dependencies are consistent with model predictions. These results conclusively demonstrate that the snap‐back characteristic is a generic response of materials with a strong temperature‐dependent conductivity and therefore has the same physical origin as the S‐type characteristic. This is a significant outcome that resolves a long‐standing controversy and provides a solid foundation for engineering functional devices with specific NDR characteristics. [ABSTRACT FROM AUTHOR]

We develop a tri-state memristive system based on composable binarized memristors, from both a dynamical systems construction to the development of in-house fabricated devices. Firstly, based on the SPICE model of the binary memristor, the series and parallel circuits of binary memristors are designed, and the characteristics of each circuit are analyzed in detail. Secondly, through the analysis of the connection direction and parameters of the two binary memristors, an effective method to construct a tri-state memristor is proposed, and verified using SPICE simulations. Finally, the characteristics of the constructed equivalent tri-state memristor are analyzed, and it is concluded that the amplitude, frequency and type of the input signal can affect the characteristics of the equivalent tri-state memristor. Predictions from this modeling were validated experimentally using Au/ Nb 2 O 5 /Nb cross-point devices. [ABSTRACT FROM AUTHOR]

Current‐controlled negative differential resistance has significant potential as a fundamental building block in brain‐inspired neuromorphic computing. However, achieving the desired negative differential resistance characteristics, which is crucial for practical implementation, remains challenging due to a lack of consensus on the underlying mechanism and design criteria. Here, a material‐independent model of current‐controlled negative differential resistance is reported to explain a broad range of characteristics, including the origin of the discontinuous snap‐back response observed in many transition metal oxides. This is achieved by explicitly accounting for a non‐uniform current distribution in the oxide film and its impact on the effective circuit of the device rather than a material‐specific phase transition. The predictions of the model are then compared with experimental observations to show that the continuous S‐type and discontinuous snap‐back characteristics serve as fundamental building blocks for composite behavior with higher complexity. Finally, the potential of our approach is demonstrated for predicting and engineering unconventional compound behavior with novel functionality for emerging electronic and neuromorphic computing applications. [ABSTRACT FROM AUTHOR]