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Atomic-resolution energy dispersive X-ray spectroscopy (EDS) in scanning transmission electron microscopy (STEM) has recently been shown to be a powerful approach to investigate local chemistry of nanoscale structures quantitatively. While most of the studies have been focused on the quantification of the chemical composition in bulk crystals, few were discussed on interfaces. In this study, we theoretically explored the applicability of STEM EDS for the quantification of local chemistry in grain boundaries (GBs), where the electron channeling can be dramatically changed compared with the bulk due to non-periodic atomic arrangement. We find that: (1) line scan analysis across the GBs or mapping analysis, which have been widely used for interface analysis, sometimes leads to misinterpretation of true interface chemistry. (2) Tilting the specimen, which is effective to reduce the effects of scattering, is not always useful for the quantification of GBs. (3) EDS analysis covering the whole GB structure unit, such as using a box scan, can provide true chemical information. Our study provides useful insights into characterization of interface chemistry using STEM EDS.

Probing the charge density distributions in materials at atomic scale remains an extremely demanding task, particularly in real space. However, recent advances in differential phase contrast-scanning transmission electron microscopy (DPC-STEM) bring this possibility closer by directly visualizing the atomic electric field. DPC-STEM at atomic resolutions measures how a sub-angstrom electron probe passing through a material is affected by the atomic electric field, the field between the nucleus and the surrounding electrons. Here, we perform a fully quantitative analysis which allows us to probe the charge density distributions inside atoms, including both the positive nuclear and the screening electronic charges, with subatomic resolution and in real space. By combining state-of-the-art DPC-STEM experiments with advanced electron scattering simulations we are able to map the spatial distribution of the electron cloud within individual atomic columns. This work constitutes a crucial step toward the direct atomic scale determination of the local charge redistributions and modulations taking place in materials systems.

Crystalline interfaces in materials often govern the macroscopic functional properties owing to their complex structure and chemical inhomogeneity. For ionic crystals, however, such understanding has been precluded by the debatable local anion distribution across crystal interfaces. In this study, using yttria-stabilized zirconia as a model material, the oxygen vacancy distribution across individual grain boundaries was directly quantified by atomic-resolution scanning transmission electron microscopy with ultrahigh-sensitive energy-dispersive X-ray spectroscopy. Combined with dynamical scattering calculations, we unambiguously show that the relative oxygen concentrations increase in four high-angle grain boundaries, indicating that the oxygen vacancies are actually depleted near the grain boundary cores. These results experimentally evidence that the long-range electric interaction is the dominant factor to determine the local point defect distribution at ionic crystal interfaces.

Room-temperature dilute ferromagnetism has been reported for many semiconducting or insulating materials, which are usually in the forms of bulk or thin film. Here, we successfully fabricated dilute ferromagnetic nanowires by using dislocations---one-dimensional lattice defects---embedded between optically transparent, nonmagnetic $\mathrm{SrTi}{\mathrm{O}}_{3}$ single crystals. At the dislocation cores, we have both locally codoped magnetic $\mathrm{M}{\mathrm{n}}^{2+}$ ions and electron donors. The structure, chemistry, and ferromagnetism of dislocations were studied by atomic-resolution scanning transmission electron microscopy combined with magnetic force microscopy. We discuss the origin of dilute ferromagnetism at the dislocations in terms of the percolation of bound magnetic polarons along the dislocation cores, where antiferromagnetic coupling between the high spin state of $\mathrm{M}{\mathrm{n}}^{2+}$ ions and electron donors leads to the long-range Mn-Mn ferromagnetic exchange interaction.

We study the effects of specimen mistilt on the picometer-scale measurement of local structure by combing experiment and simulation in annular bright-field scanning transmission electron microscopy (ABF-STEM). A relative distance measurement method is proposed to separate the tilt effects from the scan noise and sample drift induced image distortion. We find that under a typical experimental condition a small specimen tilt (∼6 mrad) in 25 nm thick SrTiO3 along [001] causes 11.9 pm artificial displacement between O and Sr/TiO columns in ABF image, which is more than 3 times of scan noise and sample drift induced image distortion ∼3.2 pm, suggesting the tilt effect could be dominant for the quantitative analysis of ABF images. The artifact depends on the crystal mistilt angle, specimen thickness, defocus, convergence angle and uncorrected aberration. Our study provides useful insights into detecting and correcting tilt effects during both experiment operation and data analysis to extract the real structure information and avoid mis-interpretations of atomic structure as well as the properties such as oxygen octahedral distortion/shift.

The physical basis for using a probe-position integrated cross section (PICS) for a single column of atoms as an effective way to compare simulation and experiment in high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) is described, and the use of PICS in order to make quantitative use of image intensities is evaluated. It is based upon the calibration of the detector and the measurement of scattered intensities. Due to the predominantly incoherent nature of HAADF STEM, it is found to be robust to parameters that affect probe size and shape such as defocus and source coherence. The main imaging parameter dependencies are on detector angle and accelerating voltage, which are well known. The robustness to variation in other parameters allows for a quantitative comparison of experimental data and simulation without the need to lit parameters. By demonstrating the application of the [PICS to the chemical identification of single atoms in a heterogeneous catalyst and in thin, layered-materials, we explore some of the experimental considerations when using this approach. (C) 2013 Elsevier B.V. All rights reserved.

Important properties of functional materials, such as ferroelectric shifts and octahedral distortions, are associated with displacements of the positions of lighter atoms in the unit cell. Annular bright-field scanning transmission electron microscopy is a good experimental method for investigating such phenomena due to its ability to image light and heavy atoms simultaneously. To map atomic positions at the required accuracy precise angular alignment of the sample with the microscope optical axis is necessary, since misalignment (tilt) of the specimen contributes to errors in position measurements of lighter elements in annular bright-field imaging. In this paper it is shown that it is possible to detect tilt with the aid of images recorded using a central bright-field detector placed within the inner radius of the annular bright-field detector. For a probe focus near the middle of the specimen the central bright-field image becomes especially sensitive to tilt and we demonstrate experimentally that misalignment can be detected with a precision of less than a milliradian, as we also confirm in simulation. Coma in the probe, an aberration that can be misidentified as tilt of the specimen, is also investigated and it is shown how the effects of coma and tilt can be differentiated. The effects of tilt may be offset to a large extent by shifting the diffraction plane detector an amount equivalent to the specimen tilt and we provide an experimental proof of principle of this using a segmented detector system.

A twist in bi- or few-layer graphene breaks the local symmetry, introducing a number of intriguing physical properties such as opening new bandgaps. Therefore, determining the twisted atomic structure is critical to understanding and controlling the functional properties of graphene. Combining low-angle annular dark-field electron microscopy with image simulations, we directly determine the atomic structure of twisted few-layer graphene in terms of a moiré superstructure which is parameterized by a single twist angle and lattice constant. This method is shown to be a powerful tool for accurately determining the atomic structure of two-dimensional materials such as graphene, even in the presence of experimental errors. Using coincidence-site-lattice and displacement-shift-complete theories, we show that the in-plane translation state between layers is not a significant structure parameter, explaining why the present method is adequate not only for bilayer graphene but also a few-layered twisted graphene.

The challenging problem of mapping the chemical composition of cation columns in individual nanocrystals at atomic resolution is addressed by using a method based on aberration-corrected electron microscopy, core-loss electron energyloss spectroscopy, and simulations. The potential of this novel approach to provide unique structural information, which is the key to rationalizing macroscopic behavior, is illustrated with the analysis of ceria–zirconia mixed oxides, which are nanomaterials with substantial technological impact. Metal nanoparticles supported on this family of oxides are currently materials of interest as catalysts in a variety of chemical transformations in the area of environmental protection, such as low-temperature water-gas shift, selective oxidation of CO in the presence of large amounts of hydrogen, or three-way catalysis. Strong variations in the chemistry of ceria–zirconia mixed oxide catalysts have been observed after they have undergone redox cycles involving reduction treatments at high temperatures ( 1173 K) then oxidation at mild temperatures ( 823 K). In particular their reducibility is significantly enhanced after such aging treatments. Scanning transmission electron microscopy (STEM) techniques have provided crucial information to account for these changes in the redox behavior. High-resolution electron microscopy (HREM) combined with high-angle annular dark-field (HAADF) imaging and tomography have revealed the occurrence of a disorder–order transformation in the cationic sublattice of these oxides, which tend to rearrange into a distribution characteristic of the so called pyrochlore phase. This phase is an archetype structure for A2B2O7 (A= + 3 cation, B=+ 4 cation) compounds and can be considered a fluorite superstructure. The structural transformation takes place during the reduction step of the cycle, in which the fully reduced mixed oxide with Ce/Zr molar ratio 1:1 adopts the Ce2Zr2O7 stoichiometry. Nevertheless, HAADF studies have clearly shown that, in the case of ceria–zirconia mixed oxides, this cation-ordered arrangement is preserved even after full reoxidation, that is, in the oxide with Ce2Zr2O8 stoichiometry, whenever the oxidation temperature does not exceed 823 K. Electron-microscopy studies have also revealed another remarkable feature of the ceria–zirconia aged oxides with the pyrochlore-type cation sublattice: the occurrence of compositional heterogeneities at the nanometer scale. Taking these observations into account and also considering that the disorder–order transition may not be completed in the time scale and under the temperature conditions used in the redox-cycling treatments, the important question arises whether these heterogeneities are in fact occurring on a finer scale, that is, at the atomic level. Such heterogeneities, compatible with the HREM and HAADF observations, will strongly influence the details of the counterpart oxygen sublattice and, consequently, the chemical and catalytic response of these oxides. To date, the atomic-column by atomic-column compositional analysis of the oxidized pyrochlore required to justify such a possibility has not been accomplished. Herein, using the capabilities of an aberration-corrected Nion UltraSTEM microscope (operated at 100 kV) we not only provide the first direct chemical evidence of the cationic order present in the Ce2Zr2O8 oxidized pyrochlore but we also show how atomicresolution electron energy-loss spectroscopy (EELS) mapping, based on core–shell ionization, can be combined with EELS image simulation to detect quite subtle local deviations in the cation sublattice from the completely ordered structure. This information provides a much more accurate structural description of the active catalyst nanocrystals, which must be considered to model both their oxygen-exchange capabilities and, eventually, their catalytic performance. [*] Dr. S. Trasobares, Dr. M. L pez-Haro, Dr. J. A. Perez-Omil, Dr. J. J. Calvino Departamento de Ciencia de los Materiales e Ingenier a Metalfflrgica y Qu mica Inorg nica Facultad de Ciencias, Universidad de C diz Campus Rio San Pedro, 11510-Puerto Real, C diz (Spain) Fax: (+34)956-016286 E-mail: susana.trasobares@uca.es Homepage: http://www.uca.es/tem-uca

We demonstrate that energy-filtered transmission electron microscopy (EFTEM) based on inner-shell ionization can contain atomic resolution information. We present a comparison between experimental data and simulation for the EFTEM image of the N 4 , 5 edge (threshold energy 99 eV) of lanthanum in LaB 6 in which direct interpretation of the location of the lanthanum columns is possible. Our first principles approach is based on calculating transition potentials for inelastic scattering. For our case study, the localization of the transition potentials is such that elastic contrast is only weakly preserved in the EFTEM image. This is not always the case, but we show how the approach based on calculating the elastic wave function and the transition potentials can provide insight about when direct interpretation may and may not be possible. In our test specimen, the direct interpretation fails for thicker specimens when the long tails of the transition potential from multiple adjacent sites leads to significant image features other than at the sites of the element of interest. We can thus anticipate instances where direct interpretation may be more reliable, such as looking for a single impurity in an otherwise well known sample.

Inelastic scattering of electrons on crystals can excite lattice vibrations known as phonons. An energy resolution of 10 meV in the scattered electron energy loss has recently been demonstrated in scanning transmission electron microscopy (STEM), permitting experimenters to distinguish between elastic and inelastic scattering events. In this paper the authors present simulations showing that, with the recent improvement in energy resolution, atomic resolution phonon spectroscopy and imaging of crystals using STEM should now be feasible.

Chemical mapping using energy dispersive X-ray spectroscopy (EDS) in scanning transmission electron microscopy (STEM) has recently shown to be a powerful technique in analyzing the elemental identity and location of atomic columns in materials at atomic resolution. However, most applications of EDS STEM have been used only to qualitatively map whether elements are present at specific sites. Obtaining calibrated EDS STEM maps so that they are on an absolute scale is a difficult task and even if one achieves this, extracting quantitative information about the specimen – such as the number or density of atoms under the probe – adds yet another layer of complexity to the analysis due to the multiple elastic and inelastic scattering of the electron probe. Quantitative information may be obtained by comparing calibrated EDS STEM with theoretical simulations, but in this case a model of the structure must be assumed a priori. Here we first theoretically explore how exactly elastic and thermal scattering of the probe confounds the quantitative information one is able to extract about the specimen from an EDS STEM map. We then show using simulation how tilting the specimen (or incident probe) can reduce the effects of scattering and how it can provide quantitative information about the specimen. We then discuss drawbacks of this method – such as the loss of atomic resolution along the tilt direction – but follow this with a possible remedy: precession averaged EDS STEM mapping.

A method to remove the effects of elastic and thermal diffuse scattering (TDS) of the incident electron probe from electron energy-loss and energy-dispersive X-ray spectroscopy data for atomically resolved spectrum images of single crystals of known thickness is presented. By calculating the distribution of the probe within a specimen of known structure, it is possible to deconvolve the channeling of the probe and TDS from experimental data by reformulating the inelastic cross-section as an inverse problem. In electron energy-loss spectroscopy this allows valid comparisons with first principles fine-structure calculations to be made. In energy-dispersive X-ray spectroscopy, direct compositional analyses such as ζ-factor and Cliff–Lorimer k-factor analysis can be performed without the complications of channeling and TDS. We explore in detail how this method can be incorporated into existing multislice programs, and demonstrate practical considerations in implementing this method using a simulated test specimen. We show the importance of taking into account the scattering of the probe in k-factor analysis in a zone axis orientation. The applicability and limitations of the method are discussed.

Elemental mapping using energy-dispersive x-ray spectroscopy in scanning transmission electron microscopy, a well-established technique for precision elemental concentration analysis at submicron resolution, was first demonstrated at atomic resolution in 2010. However, to date atomic resolution elemental maps have only been interpreted qualitatively because the elastic and thermal scattering of the electron probe confounds quantitative analysis. Accounting for this scattering, we present absolute scale quantitative comparisons between experiment and quantum mechanical calculations for both energy dispersive x-ray and electron energy-loss spectroscopy using off-axis reference measurements. The relative merits of removing the scattering effects from the experimental data against comparison with direct simulations are explored.

The near-edge fine structure of an ionization edge in electron energy-loss spectroscopy provides bonding and elemental information. We investigate the fine structure of the O $K$ edge in SrTiO${}_{3}$, where the oxygen atoms have identical local bonding environments in three dimensions but differ in their two-dimensional projection. By removing the effects of elastic and thermal diffuse scattering in experimental data, we demonstrate a small difference between the O columns that are nonequivalent in projection, which was not evident before the removal of scattering of the probing electrons. We explore the robustness of this method to the uncertainty in various experimental parameters.

Newly developed achromatic electron optics allows the use of wide energy windows and makes feasible energy-filtered transmission electron microscopy (EFTEM) at atomic resolution. In this Letter we present EFTEM images formed using electrons that have undergone a silicon L(2,3) core-shell energy loss, exhibiting a resolution in EFTEM of 1.35 Å. This permits elemental mapping beyond the nanoscale provided that quantum mechanical calculations from first principles are done in tandem with the experiment to understand the physical information encoded in the images.

There is strong interest in lithium imaging, particularly because of its significance in battery materials. However, light atoms only scatter electrons weakly and atomic resolution direct imaging of lithium has proven difficult. This paper explores theoretically the conditions under which lithium columns can be expected to be directly visible using annular bright field scanning transmission electron microscopy. A detailed discussion is given of the controllable parameters and the conditions most favourable for lithium imaging.

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (

The distorted CuO6 octahedron in La2CuO4 was studied using aberration-corrected scanning transmission electron microscopy at atomic resolution. The near-edge structure in the oxygen K-edge electron energy-loss spectrum was recorded as a function of the position of the electron probe. After background subtraction, the measured spectrum image was processed using a recently developed inversion process to remove the mixing of signals on the atomic columns due to elastic and thermal scattering. The spectra were then compared with first-principles band structure calculations based on the local-density approximation plus on-site Coulomb repulsion (LDA + U) approach. In this article, we describe in detail not only anisotropic chemical bonding of the oxygen 2p state with the Cu 3d state but also with the Cu 4p and La 5d/4f states. Furthermore, it was found that buckling of the CuO2 plane was also detectable at the atomic resolution oxygen K-edge. Lastly, it was found that the effects of core-hole in the O K-edge were strongly dependent on the nature of the local chemical bonding, in particular, whether it is ionic or covalent.

Electron energy-loss spectroscopy (EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the probing electrons. Here, we present a method for removing these effects from recorded EELS spectrum images, producing visually interpretable elemental maps and enabling direct comparison of the spectral data with established first-principles energy-loss fine structure calculations.

We discuss atomic resolution chemical mapping in scanning transmission electron microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive results which, however, can be understood using first principles calculations. Experimental chemical maps based on EDX bear out the thesis that such maps are always likely to be directly interpretable. This can be explained in terms of the local nature of the effective optical potential for ionization under those imaging conditions. This is followed by an excursion into the complementary technique of elemental mapping using energy-filtered transmission electron microscopy (EFTEM) in a conventional transmission electron microscope. We will then consider the widely used technique of Z-contrast or high-angle annular dark field (HAADF) imaging, which is based on phonon excitation, where it has recently been shown that intensity variations can be placed on an absolute scale by normalizing the measured intensities to the incident beam. Results, showing excellent agreement between theory and experiment to within a few percent, are shown for Z-contrast imaging from a sample of PbWO4 .