12 results on '"Neubauer, Gabi"'
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2. Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures
3. The Role of Indentation Depth on the Measured Hardness of Materials
4. Imaging VLSI Cross Sections by Atomic Force Microscopy
5. Hardness and Modulus Studies on Dielectric Thin Films
6. Force microscopy with a bidirectional capacitance sensor
7. Nanomechanics of a Au–Ir contact using a bidirectional atomic force microscope
8. Nanotribology of Diamond Films Studied by Atomic Force Microscopy
9. Measurement of Micromechanical Properties Using Atomic Force Microscope with Capacitative
10. Nanotribology of Diamond Films Studied by Atomic Force Microscopy.
11. Measurement of Micromechanical Properties Using Atomic Force Microscope with Capacitative.
12. The Role of Indentation Depth on the Measured Hardness of Materials.
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