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This article examines the joint nonlinearity of 15 subsets of US and economic area (EA) economic variables using two modified multivariate nonlinearity tests recently developed in the literature. Clear evidence of joint nonlinearity in both US and EA economic variables is found. Our results thus cast doubts on the adequacy of using linear multivariate (VAR-type) models, structural or not, in applied economics. [ABSTRACT FROM AUTHOR]

In this paper, we present a procedure for testing the null hypothesis of linearity in a time series against the alternative of non-linearity. Adapting the robust Wald-type testing methods of Vogelsang (1998 Econometrica 66, 123–48), we provide a test statistic that has the same limiting null critical values regardless of whether the series under consideration is generated from a linear or linear process, and is consistent against non-linearity of either form. Finite sample simulation evidence, together with empirical evidence from an application to US Dollar real exchange rates, suggests that our procedure should work well in practice. [ABSTRACT FROM AUTHOR]

This paper proposes an innovative method for Integral Nonlinearity (INL) testing, that allows to measure the voltage corresponding only to a subset of all the codes of Digital-to-Analog Converters (DAC), shortening the duration of static characterization. The method operates, in fact, a pseudo-random selection of DAC codes to be tested but, through Compressed Sensing, it is able to recover the INL value for all the codes. The proposed method is experimentally evaluated on two DACs with different architectures and thus with different trends of the INL curve. In the performed tests, the recovered curve results very close to the INL curve obtained by the standard approach, while allowing a considerable time saving. • Innovative method of Nonlinearity testing for unknown architectures. • Reduction of DAC input codes in static characterization. • Compressed Sensing for reconstruction of Integral Nonlinearity curve. • Time saving in comparison to standard procedure. • Experimental validation on different DAC architectures. [ABSTRACT FROM AUTHOR]