161 results on '"O'Keefe, M.A."'
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2. First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM
3. Atomic structure of defects in GaN:Mg grown with Ga polarity
4. Screw dislocations in GaN grown by different methods
5. Seeing atoms only 0.78A apart
6. Installing and operating FEGTEMs
7. Automation for on-line remote-control in-situ electron microscopy
8. Interpretation of HRTEM Images by Image Simulation: An Introduction to Theory and Practice
9. 3-D Imaging of Crystals at Atomic Resolution
10. The Effect of Crystal Tilt on High Resolution Micrographs of Small Metal Particles
11. Using Coherent Illumination to Extend HRTEM Resolution: Why We Need a FEG-TEM for HREM
12. Imaging of SiC in Metal Matrix Composites
13. Resolution in High-Resolution Electron Microscopy
14. Determination of the Strain Field From an HREM Image of A Si Lomer Dislocation
15. HREM Imaging of Single Unit Cel Carbide Precipitates in Pt-C Alloys
16. Resolution of Oxygen Atoms in Staurolite by Three-Dimensional Transmission
17. Comments on Interpretation of HREM Images of Mullite by S. Hamid Rahman and H.-T. Weichert
18. Comments on HRTEM-Bildkonstrastsimulation von Strukturen mit Punktdefekten in Speziellen Lagen
19. Future Contributions
20. Defects in p-doped bulk GaN crystals grown with Ga polarity
21. DELTA[SUB]2 -YC[SUB]2 SI[SUB]2 O[SUB]7 STRUCTURE CONFIRMED BY PROCESSING AND SIMULATION OF ATOMIC-RESOLUTION IMA6ES
22. RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON ATOMIC SCATTERING FACTORS AT HIGH ANGLES
23. Simulation of High Resolution Images of Wedge-Shaped Crystals
24. ON THEINCLUSION OF UPPER LAUE LAYERS IN COMPUTATIONAL METHODS IN HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY
25. IDENTIFICATION OF PERIODIC STRUCTURE CHARACTERIZED FROM AMORPHOUS SUPPORT BY SIMULATION AND PROCESSING TECHNIQUES
26. HIGH RESOLUTION ELECTRON MICROSCOPY OF THE C=30.5A[ANGSTROM] AND C=38.2A[ANGSTROM] POLYTYPOIDS IN THE BI-CA-SR-CU-O SUPERCONDUCTOR
27. ADVANCES IN HIGH-RESOLUTION IMAGE SIMULATION
28. Atomic Imaging of 3:2 Mullite
29. INVERSION BOUNDARIES IN GAAS GROWN ON SI
30. Forthcoming Contributions
31. Election microscopy at 1-angstrom resolution by entropy maximization and likelihood ranking
32. Sub-Ångstrom high-resolution transmission electron microscopy at 300 keV
33. Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution
34. Seeing atoms only 0.78A apart
35. Resolution of the Electron Microscope at the Atomic Scale
36. PPEREM: Post-Processed Extended-Resolution Electron Microscopy
37. Screw Dislocations in GaN Grown by Different Methods
38. Screw Dislocations in GaN
39. Sub-Ångstrom Transmission Electron Microscopy at 300keV
40. HRTEM Image Simulations for Gate Oxide Metrology
41. HRTEM Image Simulations of Structural Defects in Gate Oxides
42. Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm
43. Transmission Electron Holography of a GaN/AlxGal-xN Heterostructure
44. LBNL and the Materials Microcharacterization Collaboratory
45. Installing and Operating Fegtem's
46. Design and Implementation of a Site for a One-Ångstrom TEM
47. Deceptive “lattice spacings” in high-resolution micrographs of metal nanoparticles
48. Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface
49. HRTEM investigation of the interface between AIN and SiC
50. Applications of Electron Microscopy in Collaborative Industrial Research
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