234 results on '"Pászti, F."'
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2. Macroscopic Phenomena Induced by High Dose MeV Energy Implantation of He, Ne and Ar Ions
3. Fabrication of channel waveguides in Er 3+-doped tellurite glass via N + ion implantation
4. Determination of migration of ion-implanted helium in silica by proton backscattering spectrometry
5. Structural characterization of Fe/Ag bilayers by RBS and AFM
6. Comparative study of the oxide scale thermally grown on titanium alloys by ion beam analysis techniques and scanning electron microscopy
7. Magnetic nanowire arrays in anodic alumina membranes: Rutherford backscattering characterization
8. Asymmetric interfaces in Fe/Ag and Ag/Fe bilayers prepared by molecular beam evaporation
9. Effect of pre-implanted oxygen in Si on the retention of implanted He
10. In-depth RBS study of optical layers based on nanostructured silicon
11. Ion-induced tracks in Bi4Ge3O12 and Bi12GeO20 crystals
12. Pore Propagation Directions in P+ Porous Silicon
13. Optical and Structural Characterization of Erbium-Doped Ion-Implanted Tellurite Glasses for Active Integrated Optical Devices
14. RBS and ERD characterization of SiON films for optical waveguide applications
15. First measurements with the Madrid 5 MV tandem accelerator
16. Europium-doped sesquioxide thin films grown on sapphire by PLD
17. Investigation of the relation between stress evolution and surface deformations in high dose MeV energy He implanted Si
18. Considerations on effect of local temperature on primary defect production
19. Track evolution in TeO 2 at low ion velocities
20. Medium energy ion-nanoprobe with TOF-RBS for semiconductor process analysis
21. Development of enhanced depth-resolution technique for shallow dopant profiles
22. Macroscopic Phenomena Induced by High Dose MeV Energy Implantation of He, Ne and Ar Ions
23. Synthesis of cobalt silicide on porous silicon by high dose ion implantation
24. Effect of MeV energy He and N pre-implantation on the formation of porous silicon
25. Tracks induced in TeO2 by heavy ions at low velocities
26. Study of interdiffusion in amorphous Si/Ge multilayers by Rutherford backscattering spectrometry
27. Investigation of beam effect on porous silicon
28. Ion beam synthesis of chromium silicide on porous silicon
29. Application of resonant backscattering spectrometry for determination of pore structure changes
30. Three-dimensional scanning of ion-implanted porous silicon
31. Tin dioxide sol-gel derived films doped with platinum and antimony deposited on porous silicon
32. Characterization of ion-implanted silicion by Rutherford backscattering spectrometry and ellipsometry
33. Enhanced sensitivity of oxygen detection of 3.045 MeV (α, α) elastic scattering and its applications
34. BLISTERING AND EXFOLIATION ON GOLD BY 1–3.52 MeV HELIUM PARTICLES
35. Chemical applications of accelerators
36. New method to measure low Schottky barriers on n-type silicon.
37. Comparative study of the oxide scale thermally grown on titanium alloys by ion beam analysis techniques and scanning electron microscopy
38. Surface characterization of the oxide layer grown on Ti-Nb-Zr and Ti-Nb-Al alloys
39. Fabrication of channel waveguides in Er3+-doped tellurite glass via N+ ion implantation
40. Nitrogen-ion-implanted planar optical waveguides in Er-doped tellurite glass: fabrication and characterization
41. Ion beam irradiated channel waveguides in Er3+-doped tellurite glass
42. Channel waveguides fabrication in Er3+-doped tellurite glass by ion beam irradiation
43. Porosity profile determination of porous silicon interference filters by RBS
44. Positronium Trapping in Porous Solids: Means and Limitations for Structural Studies
45. Optical and In-Depth RBS Characterization of Porous Silicon Interference Filters
46. RBS Characterization of Porous Silicon Multilayer Interference Filters
47. Track evolution in TeO2 at low ion velocities
48. Tracks induced by swift heavy ions in semiconductors
49. Combined Analyses of Ion Beam Synthesized Layers in Porous Silicon
50. Pore structure investigations in porous silicon by ion beam analytical methods
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