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Your search keyword '"PACANOWSKI, S."' showing total 20 results
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20 results on '"PACANOWSKI, S."'

1. X-ray photoemission and resistivity studies of the Pd-covered Ce thin films

Author

Skokowski, P., Marczyńska, A., Pacanowski, S., Toliński, T., Szymański, B., Majchrzycki, Ł., and Smardz, L.

Subjects
Condensed Matter - Strongly Correlated Electrons, Physics - Applied Physics
Abstract

We have fabricated Ce/Pd bilayers grown on the SiO$_2$ substrate by magnetron sputtering under ultrahigh vacuum. Usage of palladium layer on top of the Ce film appears to prevent effectively the sample oxidation. The thickness of the cerium films is between 10 - 200 nm and 10 nm-thick palladium overlayers are always used. We have performed $in - situ$ X-ray photoelectron spectroscopy on the as-deposited films and $ex - situ$ electrical resistivity measurements and XRD characterization. XPS confirms a very good quality of the samples. The analysis of the Ce $3d$ spectrum suggests that the $f$ states of Ce are on the border between the fluctuating valence and localization. The resistivity measurements reveal a competition of the Kondo scattering, semiconducting and metallic behaviors as well as the influence of the dimensional effect.

Published
2018

15. Preparation and Characterisation of Fe/Ce Multilayer

Author

Dawczak-Dębicki, H., primary, Marczyńska, A., additional, Pacanowski, S., additional, Szymański, B., additional, Majchrzycki, Ł., additional, Kowalski, W., additional, Grembowski, W., additional, Bilski, T., additional, and Smardz, L., additional

Published
2018
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16. Natural Oxidation of thin Fe Films on V Buffer Layer

Author

Dawczak-Dębicki, H., primary, Marczyńska, A., additional, Rogowska, A., additional, Wachowiak, M., additional, Nowicki, M., additional, Pacanowski, S., additional, Jabłoński, B., additional, Kowalski, W., additional, Grembowski, J., additional, Czajka, R., additional, and Smardz, L., additional

Published
2017
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20. XPS Valence Band Studies of LaNi5-xMx (M = Al, Co; x = 0, 1) Alloy Thin Films.

Author

SKORYNA, J., MARCZYŃSKA, A., PACANOWSKI, S., SZAJEK, A., and SMARDZ, L.

Subjects
THIN films, CONDUCTION bands, ELECTRONIC structure, ENERGY-band theory of solids, ELLIPSOMETRY
Abstract

LaNi5-xMx (M = Al, Co) alloy thin films were prepared onto oxidised Si(100) substrates in the temperature range of 285-700 K using UHV magnetron co-sputtering. The surface chemical composition and valence bands of all the alloy thin films were measured in situ, immediately after deposition, transferring the samples to an UHV analysis chamber equipped with X-ray photoelectron spectroscopy. Results showed that the shape of the valence bands measured for the polycrystalline samples is practically the same compared to those obtained theoretically from ab initio band structure calculations. On the other hand, the X-ray photoelectron spectroscopy valence bands of the nanocrystalline thin films (especially LaNi4Co) are considerably broader compared to those measured for the polycrystalline samples. This is probably due to a strong deformation of the nanocrystals. Therefore, the different microstructure observed in polycrystalline and nanocrystalline alloy thin films leads to significant modifications of their electronic structure. [ABSTRACT FROM AUTHOR]

Published
2015
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