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1. Degradation of gate-recessed MOS-HEMTs and conventional HEMTs under DC electrical stress*

Author

Yuan, Yi-Dong, primary, Zhao, Dong-Yan, additional, Cao, Yan-Rong, additional, Wang, Yu-Bo, additional, Shao, Jin, additional, Chen, Yan-Ning, additional, He, Wen-Long, additional, Du, Jian, additional, Wang, Min, additional, Peng, Ye-Ling, additional, Zhang, Hong-Tao, additional, Fu, Zhen, additional, Ren, Chen, additional, Liu, Fang, additional, Zhang, Long-Tao, additional, Zhao, Yang, additional, Lv, Ling, additional, Zhao, Yi-Qiang, additional, Zheng, Xue-Feng, additional, Zhou, Zhi-Mei, additional, Wan, Yong, additional, and Ma, Xiao-Hua, additional

Published
2021
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