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We studied degradation mechanisms of ultraviolet InGaN laser diodes emitting in the UVA range. Short wavelength nitride devices are subjected to much faster degradation, under the same packaging and testing conditions, than their longer wavelength counterparts. Transmission electron microscopy analysis of the degraded laser diodes showed pronounced damage to facets in the area of the active layer (waveguide, quantum wells, and electron blocking layer). Energy-dispersive X-ray spectroscopy showed that the active layers were heavily oxidized, forming a compound close in composition to Ga2O3 with proportional addition of Al in the respective area. The oxidation depth was roughly proportional to the intensity of the optical field. We propose UV-light-induced water splitting on a semiconductor surface as a mechanism of the oxidation and degradation of these devices.

Gallium nitride (GaN) doped with germanium at a level of 1020 cm−3 is proposed as a viable material for cladding layers in blue- and green-emitting laser diodes. Spectral reflectometry and ellipsometry are used to provide evidence of a reduced index of refraction in such layers. The refractive-index contrast to undoped GaN is about 0.990, which is comparable to undoped aluminium gallium nitride (AlGaN) with an aluminium composition of 6%. Germanium-doped GaN layers are lattice-matched to native GaN substrates; therefore, they introduce no strain, cracks, and wafer bowing. Their use, in place of strained AlGaN layers, will enable significant improvements to the production process yield.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s2 1S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 − 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

Most optoelectronic devices share the same basic epitaxial structure – a stack of quantum wells (QWs) sandwiched between p- and n-doped layers. In nitride semiconductors, where holes have 20-times lower mobility than electrons, the holes are able to populate only the topmost 1–2 QWs. The inability to distribute the holes in a large-enough number of QWs is a cause of high Auger recombination in nitride LEDs. Lateral carrier injection is an alternative design, in which the doped regions are situated at the sides of the QW stack and the carriers diffuse horizontally into the QWs. Given that the carriers are injected into all available QWs, it finally makes sense to grow structures with a large number of QWs. We report the results of our computer simulations, which explore the advantages of LCI-based LEDs in terms of energy efficiency.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s2 1S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 – 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

For certain, growing, class of applications it is necessary to have better suiting combination of beam and spectral quality. This specific combination of beam quality and spectrally broad emission can be delivered by superluminescent diodes (SLEDs). Additionally, the expected advent of nitride integrated photonic circuits and visible light communication call for new active optical elements, such as optical semiconductor amplifiers (SOA). Within this work we will present the progress in the development of broad spectral emission (>15 nm and OSA amplifiers which reach the gain of 10-20 dB at violet-blue wavelength range.

We report on the characterization and analysis of a GaN-based distributed feedback laser diode (DFB-LD) with 3 rd -order laterally etched sidewall gratings centered at a wavelength of 420 nm. We also compare the device parameters with two commonly used Fabry-Perot (FP) devices operating at 450 nm and 520 nm. Intrinsic properties of the devices were extracted, including damping factor, carrier and photon lifetimes, modulation efficiency, differential gain, and parasitic capacitance. These parameters showed that the DFB exhibits a lower damping rate and parasitic capacitance while demonstrating a higher modulation efficiency, indicating that the DFB shows good potential for communications applications. Additionally, spectral linewidth of a GaN DFB is reported. To the authors’ knowledge, this is the first demonstration of parameter extraction and spectral linewidth measurement for GaN-based DFB-LDs.

This erratum corrects the funding of [Opt. Mater. Express 12, 991 (2022)10.1364/OME.445695].

Gallium nitride (GaN) laser diodes (LDs) are considered for visible light communications (VLC) in free space, underwater, and in plastic optical fibers (POFs). A review of recent results is presented, showing high-frequency operation of AlGaInN laser diodes with data transmission rates up to 2.5 Gbit/s in free space and underwater and high bandwidths of up to 1.38 GHz through 10 m of plastic optical fiber. Distributed feedback (DFB) GaN LDs are fabricated to achieve single-frequency operation. We report on single-wavelength emissions of GaN DFB LDs with a side-mode suppression ratio (SMSR) in excess of 35 dB.

The effect of growth temperature and precursor flows on the doping level and surface morphology of Ge-doped GaN layers was researched. The results show that germanium is more readily incorporated at low temperature, high growth rate and high V/III ratio, thus revealing a similar behavior to what was previously observed for indium. V-pit formation can be blocked at high temperature but also at low V/III ratio, the latter of which however causing step bunching.

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s2 1S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 – 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

There is an ever-growing need for compact sources which can be used for the cooling process in high accuracy atomic clocks. Current systems make use of large, expensive lasers which are power-hungry and often require frequency doubling in order to hit the required wavelengths. Distributed feedback (DFB) lasers have been fabricated at a number of key wavelengths which would allow chip scale atomic devices with very high accuracy to become a reality. Two key atomic transitions analysed here are 88 Sr + and 87 Rb which require cooling at 422 nm and 780.24 nm, respectively. The vital parameter of the DFB lasers for this application is the linewidth, as very narrow linewidths are required in order for the atomic cooling process to occur. The lasers realised here produce the required power levels, with high side-mode suppression ratios and show good single mode tuning which is important for hitting precise wavelengths. This work will present the latest techniques and results using the DFB lasers at both wavelengths.

Quantum technologies containing key GaN laser components will enable a new generation of high precision quantum sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the u.v. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for optical clocks and cold-atom interferometry systems. This includes the [5s2S1/2-5p2P1/2] cooling transition in strontium+ ion optical clocks at 422 nm, the [5s21S0-5p1P1] cooling transition in neutral strontium clocks at 461 nm and the [5s2s1/2 – 6p2P3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

We have fabricated tunnel-junction InGaN micro-LEDs using plasma-assisted molecular beam epitaxy technology, with top-down processing on GaN substrates. Devices have diameters between 5 µm and 100 µm. All of the devices emit light at 450 nm at a driving current density of about 10 A c m − 2 . We demonstrate that within micro-LEDs ranging in size from 100 µm down to 5 µm, the properties of these devices, both electrical and optical, are fully scalable. That means we can reproduce all electro-optical characteristics using a single set of parameters. Most notably, we do not observe any enhancement of non-radiative recombination for the smallest devices. We assign this result to a modification of the fabrication process, i.e., replacement of deep dry etching by a tunnel junction for the current confinement. These devices show excellent thermal stability of their light emission characteristics, enabling operation at current densities up to 1 k A c m − 2 .

In this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial process. All structures were produced by metalorganic vapour phase epitaxy and emit light in the range 383–477 nm. We observe that intensity of electroluminescence is strong in the whole spectral region for devices grown on GaN, but decreases rapidly for the devices on sapphire and emitting at wavelength shorter than 420 nm. We interpret this behaviour in terms of increasing importance of dislocation related nonradiative recombination for low indium content structures. Our studies show that edge dislocations are the main source of nonradiative recombination. We observe that long wavelength emitting structures are characterized by higher average light intensity in cathodoluminescence and better thermal stability. These findings indicate that diffusion path of carriers in these samples is shorter, limiting the amount of carriers reaching nonradiative recombination centers. According to TEM images only mixed dislocations open into the V-pits, usually above the multi quantum wells thus not influencing directly the emission.

Quantum based devices offer distinct advantages over conventional technology, such as improved sensitivity for sensing applications or enhanced accuracy for metrology. To utilize this potential, a number of technical requirements must be met, such as the cooling and trapping of neutral atoms for their use as quantum systems. We present our work on InGaN-based semiconductor cooling lasers for a variety of atomic species such as strontium, magnesium and ytterbium whos target wavelength was met by quantum-well composition engineering. Results on growth-epitaxy, facet coating as well as different configurations such as ECDL and MOPAs are presented, depending on the requirement of the application.

Our goal is to fabricate a laser diode 2D array which combines the properties of both VCSEL and edge emitting laser. Proposed light emitter will have a horizontal cavity with 450 deflectors. The role of these deflectors would be to deflect light perpendicular to the cavity, achieving vertical out-coupling. The most challenging part of this project is the fabrication of the micro-mirrors which act as both as beam deviating mirrors and cavity forming mirrors. Owing to the excellent thermal conductivity of GaN substrates the properties of such a 2D array should be better than of conventional nitride laser diode arrays, not even mentioning nitride-based stacked bars systems. In this paper I will describe our new device design and processing, giving insight to its possible applications and advantages over simple light emitting laser diode.

We analyze the evolution of the exciton recombination energy ${E}_{\mathrm{PL}}$ and its pressure coefficient $d{E}_{\mathrm{PL}}/dp$, with the laser power density (LPD) exciting excitonic photoluminescence. Two $\mathrm{I}{\mathrm{n}}_{0.17}\mathrm{G}{\mathrm{a}}_{0.83}\mathrm{N}/\mathrm{GaN}$ quantum well (QW) structures are used: sample A consisting of a 5.2-nm-wide single QW and sample B consisting of two 2.6-nm-wide QWs separated by a 0.78-nm-thick barrier. Changes of ${E}_{\mathrm{PL}}$ and $d{E}_{\mathrm{PL}}/dp$ with LPD in both structures cover a wide range of magnitude. They switch character in the vicinity of the indirect to direct exciton induced by increasing LPD. In sample B, at low excitation, a negative pressure coefficient of ${E}_{\mathrm{PL}}$ has been found. Moreover, pressure dependences of ${E}_{\mathrm{PL}}$ are different for the two samples under study. We examined pressure dependence of the threshold LPD for indirect-direct exciton switching in both samples. The reported observations originate to a high extent from screening of a built-in electric field by carriers externally introduced into the quantum wells. We also note that the universal relation between transition energies and their pressure coefficients (observed previously in InGaN/GaN quantum wells) does not hold for samples modified by screening.

We report on GaN lasers with extremely narrow linewidth (~1MHz) at ‘magic wavelengths’ for cold-atom interferometry quantum sensors, using extended cavity GaN laser diodes and DFB GaN laser diodes.

We studied mechanisms of recombination in InGaN quantum wells in polar and semipolar structures. Photoluminescence measurements show that the optical emission linewidths for polar and semipolar structures are almost identical suggesting the same level of indium fluctuations in quanutm wells. Their “peak-energy-versus-temperature” relations demonstrate very pronounced “s-shape” effect. Emission linewidth measured by cathodoluminescence does not depend on area from which the light is collected meaning that the fluctuations are smaller that 100 nm. The time scale of recombination process are of the order of 80 ns for polar and 2 ns for semipolar. Energy dispersion of the recombination time is strong in polar structures and very weak in semipolar ones which can be interperted in terms of electric field influence on photoluminescence lifetime energy dispersion. At room temparture emmission is dominated by Schockley-Hall-Read recombination and does not show any dispersion. Rate equation analysis of photoluminescence transients show domination of excitonic recombination in the case of polar samples (low temperature) and bimolecular in the case of semipolar ones. Both types of quantum wells, polar and semipolar look similar from the point of view of localization but differ in their radiative recombination mechanisms.

We report on the results of the investigation of the influence of an additional a-directed off-cut of the substrate on the opto-electrical properties of the laser diodes grown on bulk GaN with initial misorientation 0.3° towards the m-direction. The investigated a-directed off-cut is varied from 0° up to 1° by means of multilevel laser lithography and dry etching. The results show that the increase of the a-directed off-cut causes the decrease of internal optical losses and increase of injection efficiency. In consequence, the devices fabricated on the wafer areas characterized by higher a-directed off cut are characterized by the lower threshold current, and higher slope and wall-plug efficiencies.

The aim of this paper is to illustrate the dependence of DLTS characteristics and degradation of InGaN-based laser diodes (LDs) on the density of dislocations. Three groups of multi-quantum well LDs with different dislocation densities were submitted to constant current stress, at room temperature: the analysis is based on combined electrical-optical measurements and Deep-Level Transient Spectroscopy (DLTS) investigation was made before and after stress. DLTS results show the presence of a hole trap in all the samples, whose intensity is related to the dislocation density. Constant current stress induces a significant decrease in the optical power (subthreshold regime), not related exclusively to the dislocation density, and the appearance of a new deep level for electrons (point defect generated after stress).

Theoretical predictions of high hydrogen diffusivity in p-GaN layers were confirmed in many experiments for samples grown by Metalorganic Vapor Phase Epitaxy (MOVPE). In this technology, p-GaN has a high concentration of hydrogen incorporated during the growth. In this work, we confirm that also in hydrogen-free p-GaN grown by Plasma Assisted Molecular Beam Epitaxy (PAMBE) the hydrogen diffusion during H2+NH3 annealing is much higher than in n-type layers. Additionally, we have compared hydrogen diffusion for samples of different dislocation density and we have found no effect of these defects. The photoluminescence of the PAMBE-grown p-GaN exhibited the following change after annealing in H2+NH3 atmosphere: the blue luminescence decrease and yellow luminescence increase.

In this work, we investigate the role of the electron blocking layer (EBL) in laser diodes based on a graded index separate confinement heterostructure. We compare two sets of devices with very different EBL aluminum composition (3% and 12%) and design (graded and superlattice). The results of electro-optical characterization of these laser diodes reveal surprisingly modest role of electron blocking layer composition in determination of the threshold current and the differential efficiency values. However, EBL structure influences the operating voltage, which is decreased for devices with lower EBL and superlattice EBL. We observe also the differences in the thermal stability of devices – characteristic temperature is lower for lasers with 3% Al in EBL.