1. N-rich Zr3N4 nanolayers-dependent superhard effect and fracture behavior in TiAlN/Zr3N4 nanomultilayer films.
- Author
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Wang, L.P., Qi, J.L., Cao, Y.Q., Zhang, K., Zhang, Y., Hao, J., Ren, P., and Wen, M.
- Subjects
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MULTILAYERED thin films , *MAGNETRON sputtering , *TRANSMISSION electron microscopy , *FRACTURE toughness , *MATERIAL plasticity - Abstract
The TiAlN/Zr 3 N 4 nanomultilayer films were successfully fabricated by alternatively inserting nitrogen-rich orthorhombic o-Zr 3 N 4 monolayers onto TiAlN nanolayers via magnetron sputtering, and then the Zr 3 N 4 layer thicknesses (l Zr3N4)-dependent microstructure, hardness and deformation behavior was further explored. At a thin l Zr3N4 of =1.1 nm, Zr 3 N 4 nanolayers were forced to crystallize with a metastable cubic c-Zr 3 N 4 pseudocrystal structure and form (111)-oriented c-TiAlN/c-Zr 3 N 4 coherent interfaces with c-TiAlN sublayers, thereby achieving maximum H of 34.7 GPa yet superior toughness. For a thicker l Zr3N4 , Zr 3 N 4 nanolayers gradually transformed from the pseudocrystal c-Zr 3 N 4 to bulk-energy-stabilized o-Zr 3 N 4 ; it destroyed the coherent growth and yielded fast drop in both H and fracture toughness. Furthermore, the indenter induced deformation behavior of the nanomultilayer with l Zr3N4 = 4.2 nm was observed by transmission electron microscopy (TEM), thus indicating that severe plastic deformation in the nanomultilayer is primarily accommodated via the bending of nanolayers and formation of nanoscale longitudinal and lateral cracks rather than the formation of large-scale cracks because of crack deflections that can be attributed to layer interfaces. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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