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The paper describes the physicochemical methods by which semiconductor objects can be diagnosed. The goal is to use these objects to monitor one of the toxic components of the chemical industry, ammonia gas. Semiconductor solid solutions based on binary compounds of cadmium telluride and zinc sulfide were chosen as objects of study. Using elementary methods, the possibility of determining the nature of the surface properties of semiconductors is shown. It is on them that the choice of the most sensitive sample to ammonia is based. [ABSTRACT FROM AUTHOR]

The work is devoted to the search for new materials that are highly sensitive to ammonia as one of the toxic components of emissions in the air of the working area of the petrochemical and chemical industries. Comprehensive studies of the bulk and surface properties of the components of the studied semiconductor system based on cadmium sulfide and zinc telluride have been carried out. Parallels of dependence between the obtained data are drawn. A sample with a more active surface to the adsorbate gas is proposed, which can be used as a base for an ammonia sensor. [ABSTRACT FROM AUTHOR]

The work is devoted to the search for new materials for the detection and monitoring of ammonia as one of the toxic components of the chemical and petrochemical industry. A large-scale work was carried out, based on versatile sensitivity studies of solid solutions semiconductor surface obtained from binary compounds of cadmium telluride and zinc sulphide to ammonia. A correlation between the data obtained was revealed and a sample with a more active surface to the gas adsorbate was proposed as a material for the ammonia sensor. [ABSTRACT FROM AUTHOR]