25 results on '"Roqué-Velasco, Alex"'
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2. New metrology technique for measuring the free shape of a patterned 300mm wafer held vertically
3. New wafer shape measurement technique for 300mm blank vertically held silicon wafer
4. New wavefront phase sensor used for 3D shape measurements of silicon wafers
5. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers
6. Wave front phase imaging for silicon wafer metrology
7. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
8. New metrology technique for measuring the free shape of a patterned 300mm wafer held vertically
9. Stria measurement using wave front phase imaging on an artificial plate
10. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
11. New wafer shape measurement technique for 300mm blank vertically held silicon wafer
12. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers
13. New wavefront phase sensor used for 3D shape measurements of silicon wafers
14. The optics of the human eye at 8.6 µm lateral resolution
15. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
16. Stria measurement using wave front phase imaging on a transparent plate
17. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
18. Anàlisi tèrmic amb OpenFOAM® d'un forn de flux de neutrons per tal d'estudiar els gradients tèrmics de la mostra
19. New wafer shape measurement technique for 300mm blank vertically held silicon wafer.
20. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers.
21. New wavefront phase sensor used for 3D shape measurements of silicon wafers.
22. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers.
23. Wave front phase imaging for silicon wafer metrology
24. Stria measurement using wave front phase imaging on a transparent plate.
25. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer.
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