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Fingerprint analysis is a ubiquitous tool for pattern recognition with applications spanning from geolocation and DNA analysis to facial recognition and forensic identification. Central to its utility is the ability to provide accurate identification without an a priori mathematical model for the pattern. We report a data-driven fingerprint approach for nanoelectromechanical systems mass spectrometry (NEMS-MS) that enables mass measurements of particles and molecules using complex, uncharacterized nanoelectromechanical devices of arbitrary specification. NEMS-MS is based on the frequency shifts of the NEMS vibrational modes induced by analyte adsorption. The sequence of frequency shifts constitutes a fingerprint of this adsorption, which is directly amenable to pattern matching. Two current requirements of NEMS-based mass spectrometry are: (1) a priori knowledge or measurement of the device mode-shapes, and (2) a mode-shape-based model that connects the induced modal frequency shifts to mass adsorption. This may not be possible for advanced NEMS with three-dimensional mode-shapes and nanometer-sized features. The advance reported here eliminates this impediment, thereby allowing device designs of arbitrary specification and size to be employed. This enables the use of advanced NEMS devices with complex vibrational modes, which offer unprecedented prospects for attaining the ultimate detection limits of nanoelectromechanical mass spectrometry., Comment: 41 pages, 14 figures

Implantable silicon neural probes with integrated nanophotonic waveguides can deliver patterned dynamic illumination into brain tissue at depth. Here, we introduce neural probes with integrated optical phased arrays and demonstrate optical beam steering in vitro. Beam formation in brain tissue was simulated and characterized. The probes were used for optogenetic stimulation and calcium imaging.

We implement a thermal-fluctuation driven logical bit reset on a superconducting flux logic cell. We show that the logical state of the system can be continuously monitored with only a small perturbation to the thermally activated dynamics at 500 mK. We use the trajectory information to derive a single-shot estimate of the work performed on the system per logical cycle. We acquire a sample of $10^5$ erasure trajectories per protocol, and show that the work histograms agree with both microscopic theory and global fluctuation theorems. The results demonstrate how to design and diagnose complex, high-speed, and thermodynamically efficient computing using superconducting technology., Comment: 9 pages, 7 figures

We experimentally demonstrate that highly structured distributions of work emerge during even the simple task of erasing a single bit. These are signatures of a refined suite of time-reversal symmetries in distinct functional classes of microscopic trajectories. As a consequence, we introduce a broad family of conditional fluctuation theorems that the component work distributions must satisfy. Since they identify entropy production, the component work distributions encode both the frequency of various mechanisms of success and failure during computing, as well giving improved estimates of the total irreversibly-dissipated heat. This new diagnostic tool provides strong evidence that thermodynamic computing at the nanoscale can be constructively harnessed. We experimentally verify this functional decomposition and the new class of fluctuation theorems by measuring transitions between flux states in a superconducting circuit., Comment: 13 pages, 3 figures, supplementary material; http://csc.ucdavis.edu/~cmg/compmech/pubs/tcft.htm

One of the main challenges to overcome to perform nanomechanical Mass Spectrometry (NEMS-MS) analysis in a practical time frame stems from the size mismatch between the analyte beam and the extremely small nanomechanical detector area. We report here the demonstration of NEMS-MS with arrays of 20 individually addressed nanomechanical resonators where the number of inputs-outputs for the whole array is the same as that of a single resonator. While all resonators within an array are interconnected via two metal levels, each resonator is designed with a distinct resonance frequency which becomes its individual address. In order to perform single-particle Mass Spectrometry, the resonance frequencies of the two first modes of each NEMS within an array are monitored simultaneously. Using such an array, mass spectra of metallic aggregates in the MDa range are acquired with more than one order of magnitude improvement in analysis time due to the increase in capture cross section compared to individual resonators. A 20 NEMS array is probed in 150ms with the same mass limit of detection as a single resonator. Spectra acquired with a conventional Time- of-Flight (TOF) mass spectrometer in the same system show excellent agreement. As individual information for each resonator within the array is retained, the array becomes a particle imager, each resonator acting as a pixel. With this technique, we demonstrate how Mass Spectrometry Imaging (MSI) at the single particle level becomes possible by mapping a 4cm-particle beam in the MDa range and above.

Frequency stability is key to performance of nanoresonators. This stability is thought to reach a limit with the resonator's ability to resolve thermally-induced vibrations. Although measurements and predictions of resonator stability usually disregard fluctuations in the mechanical frequency response, these fluctuations have recently attracted considerable theoretical interest. However, their existence is very difficult to demonstrate experimentally. Here, through a literature review, we show that all studies of frequency stability report values several orders of magnitude larger than the limit imposed by thermomechanical noise. We studied a monocrystalline silicon nanoresonator at room temperature, and found a similar discrepancy. We propose a new method to show this was due to the presence of frequency fluctuations, of unexpected level. The fluctuations were not due to the instrumentation system, or to any other of the known sources investigated. These results challenge our current understanding of frequency fluctuations and call for a change in practices.

Current approaches to Mass Spectrometry (MS) require ionization of the analytes of interest. For high-mass species, the resulting charge state distribution can be complex and difficult to interpret correctly. In this article, using a setup comprising both conventional time-of-flight MS (TOF-MS) and Nano-Electro-Mechanical-Systems-based MS (NEMS-MS) in situ, we show directly that NEMS-MS analysis is insensitive to charge state: the spectrum consists of a single peak whatever the species charge state, making it significantly clearer than existing MS analysis. In subsequent tests, all charged particles are electrostatically removed from the beam, and unlike TOF-MS, NEMS-MS can still measure masses. This demonstrates the possibility to measure mass spectra for neutral particles. Thus, it is possible to envisage MS-based studies of analytes that are incompatible with current ionization techniques and the way is now open for the development of cutting edge system architectures with unique analytical capability.

The effect of surface stress on the stiffness of cantilever beams remains an outstanding problem in the physical sciences. While numerous experimental studies report significant stiffness change due to surface stress, theoretical predictions are unable to rigorously and quantitatively reconcile these observations. In this Letter, we present the first controlled measurements of stress-induced change in cantilever stiffness with commensurate theoretical quantification. Simultaneous measurements are also performed on equivalent clamped-clamped beams. All experimental results are quantitatively and accurately predicted using elasticity theory. We also present conclusive experimental evidence for invalidity of the longstanding and unphysical axial force model, which has been widely applied to interpret measurements using cantilever beams. Our findings will be of value in the development of micro- and nanoscale resonant mechanical sensors., Comment: 12 pages, 3 figures

We describe and demonstrate a new oscillator topology, the parametric feedback oscillator (PFO). The PFO paradigm is applicable to a wide variety of nanoscale devices, and opens the possibility of new classes of oscillators employing innovative frequency-determining elements, like such as nanoelectromechanical systems (NEMS), facilitating integration with circuitry, and reduction in cost and system size reduction. We show that the PFO topology can also improve nanoscale oscillator performance by circumventing detrimental effects that are otherwise imposed by the strong device nonlinearity in this size regime., Comment: 17 pages, 3 figures

Recent studies demonstrate that an individual magnetic domain wall (DW) can be trapped and reproducibly positioned within multiterminal (Ga,Mn)As microdevices. The electrical resistance obtained from such measurements is found to be measurably altered by the presence of this single entity. To elucidate these observations we develop a simple model for the electrical potential distribution along a multiterminal device in the presence of a single DW. This is employed to calculate the effect of a single DW upon the longitudinal and transverse resistance. The model provides very good agreement with experimental observations, and serves to highlight important deviations from simple theory. We show that measurements of transverse resistance along the channel permits establishing the position and the shape of the DW contained within it. An experimental scheme is developed that enables unambiguous extraction of the intrinsic DW resistivity. This permits the intrinsic contribution to be differentiated from resistivities originating from the bulk and from magnetic anisotropy - effects that are generally manifested as large backgrounds in the experiments., Comment: Submitted to Physical Review B