1. Automated simulation of scanning tunneling microscope functional parameters
- Author
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Roman Maisakovskyi, Ruslan Golovatskyy, Konstantin Kolesnyk, and Roman Panchak
- Subjects
Conventional transmission electron microscope ,Scanning Hall probe microscope ,Materials science ,Microscope ,business.industry ,Spin polarized scanning tunneling microscopy ,Electrochemical scanning tunneling microscope ,law.invention ,Scanning probe microscopy ,Optics ,law ,Microscopy ,Scanning tunneling microscope ,business - Abstract
In this paper cantilever detection methods of microscopy that allow to get an image of surface with high spatial resolution are discussed. The functionality of the scanning tunneling microscope and principle of its operation are analyzed. Basing on the simulated data, it is possible to show how microscope operating parameters affect the results of its measurements.
- Published
- 2016
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