Search

Research on aging processes of Gas Electron Multipliers (GEMs) is important to obtain insights on how to increase the detector's longevity, stability, and performance, as highlighted in the latest developments roadmap by the European Council of Future Accelerators (ECFA). One key aspect of the aging process is the deposit formation on the electrodes surfaces. In this work, through the analysis of the molecular content on the surface of a used GEM, we provide evidence for polyimide redeposition as a source of organic material contributing to the formation of insulating layers on the electrodes, which eventually lead to sparks and detector failure. Furthermore, we show that chromium, used to promote adhesion between copper and polyimide, in the device undergoes a diffusion process, effectively blurring the layered structure. We demonstrate the significance of surface-sensitive chemical analysis to investigate the surface deposits on electrodes of gaseous detectors and our results reveal the necessity of standardization and more stringent study protocols., Comment: 19 pages and 10 figures

With a growing demand for accurate ion beam analysis on a large number of samples, it becomes an issue of how to ensure the quality standards and consistency over hundreds or thousands of samples. In this sense, a virtual assistant that checks the data quality, emitting certificates of quality, is highly desired. Even the processing of a massive number of spectra is a problem regarding the consistency of the analysis. In this work, we report the design and first results of a virtual layer under implementation in our laboratory. It consists of a series of systems running in the cloud that perform the mentioned tasks and serves as a virtual assistant for member staff and users. We aim to bring the concept of the Internet of Things and artificial intelligence closer to the laboratory to support a new generation of instrumentation., Comment: 9 pages, 4 figures, 2019 Ion Beam Analysis Conference