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The complex physicochemical phenomena occurring in the contact line region of an evaporating meniscus are described using a unique combination of high-resolution experimental data and three complementary models. The following were used: (1) high-resolution experimental liquid profile data (thickness, slope, curvature and curvature gradient) to obtain the pressure gradient in the evaporating pentane meniscus in a vertical constrained vapor bubble (VCVB); (2) macroscopic outside surface temperature profile data; (3) a finite element model to obtain the two-dimensional heat conduction profile in the solid substrate wall (macro-model) and the solid–liquid interfacial temperature profile in the evaporating meniscus region; (4) a continuum fluid-dynamics model (micro-model) to obtain the liquid–vapor interfacial temperature, mass flow rate, Marangoni stresses, and evaporative heat flux profiles along the length of the evaporating meniscus; and (5) the Kelvin–Clapeyron model to obtain the vapor temperature profile (liquid–vapor interfacial temperature jump) in the evaporating meniscus region. The retarded dispersion constant and high-resolution thickness, slope, curvature and curvature gradient profiles were obtained from the experimental reflectivity profiles. There was a substantial increase in the measured curvature in the transition region, where the evaporation rate and flux are a maximum. To obtain numerical closure between the three complementary models, the continuum fluid dynamics model (micro-model) required slip at the solid–liquid interface to support the observed high mass flow rates in the evaporating pentane meniscus. Mass flow rates due to Marangoni stresses, capillary pressure and disjoining pressure are compared. Depending on the liquid thickness, Marangoni stresses can either enhance or hinder fluid flow towards the contact line for the evaporating pure pentane meniscus. Due to the high heat removal rate by the evaporating pentane meniscus in the transition region, dips in the vapor, liquid–vapor and solid–liquid interface temperature were obtained. The results demonstrate and describe the sensitivity and complexity of the phase change process in micro-regions.

Image analyzing interferometry was used to study the spreading characteristics of an evaporating octane meniscus (purity: 99+%) on a quartz surface. The thickness, slope, and curvature profiles in the contact line region of the meniscus were obtained using a microscopic data analysis procedure. The results obtained for the octane were compared to that of pure pentane (purity: >99.8%) under similar operating conditions. Isothermal experimental conditions of the menisci were used for the in situ estimation of the retarded dispersion constant. The experimental results for the pure pentane demonstrate that the disjoining pressure (the intermolecular interactions) in the thin-film region controls the fluid flow. Also, an imbalance between the disjoining pressure in the thin-film region and the capillary pressure in the thicker meniscus region resulted in a creeping evaporating pentane meniscus, which spreads over the solid (quartz) surface. On the contrary, for less pure octane, the intermolecular interactions between octane and quartz had a significantly different contribution for fluid flow, and hence, the octane meniscus of lower purity did not creep over the quartz surface. As a result, we had a stationary, evaporating octane meniscus. Using the experimental data and a simple model for the velocity distribution, we evaluated the Marangoni shear in a portion of the stationary, evaporating octane meniscus. An extremely small change in the concentration due to distillation had a significant effect on fluid flow and microscale heat transfer. Also, it was found that nonidealities in small interfacial systems, i.e., the presence of impurities in the working fluid, can have a significant effect on the thickness of the adsorbed film, the heat flux, the spreading characteristics of an almost pure fluid, and, therefore, the assumptions in modeling.

The evaporative heat flux distribution in the leading edge region of a moving evaporating thin liquid film of pentane on quartz was obtained by analyzing the measured thickness profile for thicknesses, δ < 2 μm. The profiles in a constrained vapor bubble were obtained using image analyzing interferometry. Although the evaporating meniscus appeared to be benign (i.e., without additional observed motion beyond creeping), high heat fluxes were obtained. Significantly higher heat fluxes are possible. The interfacial slope, curvature, interfacial shear stress, and liquid pressure profiles were also obtained. Results obtained using a continuum model were consistent with those obtained using a control volume model. The measured pressure field profile of the isothermal extended meniscus agreed with the constant pressure field predicted by the augmented Young-Laplace model. For the non-isothermal case, measured thickness gradients lead to disjoining pressure and curvature gradients for fluid flow and evaporation. The experimental results demonstrate that disjoining pressure at the contact line controls fluid flow within an evaporating completely wetting thin curved film and is, therefore, a useful boundary condition. However, in small interfacial systems, non-idealities can have a dramatic effect.

Using image-analyzing interferometry, the thickness profile, in the range of δ0 (adsorbed thickness)

A vertical constrained vapor bubble, VCVB, made of fused silica was used to study the stability and oscillations of an evaporating wetting film of HFE- 7000® in a corner. The film thickness profile was measured as a function of time and axial position using an advanced form of image analyzing interferometry. The curvature, apparent contact angle, and pressure profiles for the evaporating film were calculated from the measured film thickness profiles. Oscillation of the liquid film was observed and profiles for both the advancing and receding films were obtained. These are the first such detailed profiles obtained for an oscillating meniscus below a thickness of 0.1 μm. The film thickness profiles demonstrated the spreading of the meniscus during advance as well as the presence of a curvature gradient near the contact line region. The maximum curvature decreased for the advancing menisci and increased with time for the receding menisci. An increase in the adsorbed film thickness was associated with the advancing stage and a decrease with the receding stage. Pressure profiles were measured as a function of position indicating the potential for driving the flow of the fluid toward or away from the contact line. As the film advances or recedes, the pressure gradients change as a function of position fueling the next oscillation cycle.

The thickness and curvature profiles in the contact line region of a moving evaporating thin liquid film of pentane on a quartz substrate were measured for the thickness region, δ < 2.5 microns. The critical region, δ < 0.1 microns, was emphasized. The profiles were obtained using image analyzing interferometry and an improved data analysis procedure. The precursor adsorbed film, the thickness, the curvature, and interfacial slope (variation of the local “apparent contact angle”) profiles were consistent with previous models based on interfacial concepts. Isothermal equilibrium conditions were used to evaluate the Hamaker constant in-situ and to verify the accuracy of the procedures. The profiles give fundamental insights into the phenomena of phase change, pressure gradient, fluid flow, spreading, and the physics of interfacial phenomena in the contact line region. The experimental results demonstrate explicitly for the first time, with microscopic detail, that the disjoining pressure controls fluid flow within an evaporating completely wetting thin curved film and the stability of the thin film. The change in the thickness of the adsorbed film with time is demonstrated for the first time.