31 results on '"Schatzberger, Gregor"'
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2. Analyse und Kompensation von Stressauswirkungen auf CMOS-Referenzstromquellen
3. Analysis and Compensation of Stress Effects on CMOS Reference Current Sources
4. Ring Oscillator Based Smart Temperature Sensor Using All-Digital Sigma-Delta Modulator
5. An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories
6. Delay and Offset Compensated Relaxation Oscillator Core with Replica Integrator
7. Low-Power Frequency-Locked Loop Circuit with Short Settling Time
8. Post-Manufacturing Process and Temperature Calibration of a 2-MHz On-Chip Relaxation Oscillator
9. Self-Referenced 32-kHz Rotating Capacitor Relaxation Oscillator with Chopped Comparator Offset-Voltage Cancellation
10. Programmable low-frequency divider in 180-nm CMOS technology
11. Semi-Analytical Estimation of On-Chip Intertwined Rectangular Transformer Parameters in 180 nm CMOS Technology
12. Design of CMOS Temperature Sensors Based on Ring Oscillators in 180-nm and 110-nm technology
13. Design of a tunable temperature coefficient voltage reference with low-dropout voltage regulator in 180-nm CMOS technology
14. Design and measurements of low power 32-kHz oscillators and a test interface in 180-nm CMOS technology
15. Program Time Effects on Total Ionizing Dose Tolerance of Sidewall Spacer Memory Bit Cell
16. Design Methodology of an On–Chip Inductor in 180 nm CMOS Technology
17. A 1-MHz Relaxation Oscillator Core Employing a Self-Compensating Chopped Comparator Pair
18. Design of Sense Amplifiers for Non-Volatile Memory
19. High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs
20. A 1-MHz Relaxation Oscillator Core Employing a Self-Compensating Chopped Comparator Pair
21. Impacting accuracy of chipmaker's quality tests
22. A 1-MHz on-chip relaxation oscillator with comparator delay cancelation
23. Fault-based test methodology for analog amplifier circuits
24. Characterization of measurement system for high-precision oscillator measurements
25. Fast Bit Screening of Automotive Grade EEPROMs—Continuous Improvement Exercise
26. Variation and failure characterization through pattern classification of test data from multiple test stages
27. Variation and Failure Characterization Through Pattern Classification of Test Data From Multiple Test Stages
28. Yield improvement of an EEPROM for automotive applications while maintaining high reliability
29. Efficient contact screening of compact NVMs for high reliabilty automotive applications
30. Automotive EEPROM Qualification and Cost Optimization
31. Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM Module
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