28 results on '"Scopece, D"'
Search Results
2. Mapping the Structure of Oxygen-Doped Wurtzite Aluminum Nitride Coatings From Ab Initio Random Structure Search and Experiments
- Author
-
Gasparotto, P., Fischer, M., Scopece, D., (0000-0001-7933-7295) Liedke, M. O., (0000-0003-3674-0767) Butterling, M., (0000-0001-7575-3961) Wagner, A., Yildirim, O., Trant, M., Passerone, D., Hug, H. J., Pignedoli, C. A., Gasparotto, P., Fischer, M., Scopece, D., (0000-0001-7933-7295) Liedke, M. O., (0000-0003-3674-0767) Butterling, M., (0000-0001-7575-3961) Wagner, A., Yildirim, O., Trant, M., Passerone, D., Hug, H. J., and Pignedoli, C. A.
- Abstract
Machine learning is changing how we design and interpret experiments in materials science. In this work we show how unsupervised learning, combined with ab initio random structure searching, improves our understanding of structural metastability in multicomponent alloys. We focus on the case of Al-O-N alloys where the formation of aluminum vacancies in wurtzite AlN upon the incorporation of substitutional oxygen can be seen as a general mechanism of solids where crystal symmetry is reduced to stabilize defects. The ideal AlN wurtzite crystal structure occupation cannot be matched due to the presence of an aliovalent hetero-element into the structure. The traditional interpretation of the c-lattice shrinkage in sputter-deposited Al-O-N films from X-ray diffraction (XRD) experiments suggests the existence of a solubility limit at 8 at.% oxygen content. Here we show that such naive interpretation is misleading. We support XRD data with accurate ab initio modeling and dimensionality reduction on advanced structural descriptors to map structure-property relationships. No signs of a possible solubility limit are found. Instead, the presence of a wide range of non-equilibrium oxygen-rich defective structures emerging at increasing oxygen contents suggests that the formation of grain boundaries is the most plausible mechanism responsible for the lattice shrinkage measured in Al-O-N sputtered films. We further confirm our hypothesis using positron annihilation lifetime spectroscopy.
- Published
- 2021
3. SiGe nano-stressors for Ge strain-engineering
- Author
-
Barget, M, Bollani, M, Chrastina, D, Gagliano, L, Rossetto, L, Scopece, D, Mondiali, V, Frigerio, J, Borriello, M, Lodari, M, Pezzoli, F, Montalenti, F, Bonera, E, BARGET, MICHAEL REINER, SCOPECE, DANIELE, PEZZOLI, FABIO, MONTALENTI, FRANCESCO CIMBRO MATTIA, BONERA, EMILIANO, Barget, M, Bollani, M, Chrastina, D, Gagliano, L, Rossetto, L, Scopece, D, Mondiali, V, Frigerio, J, Borriello, M, Lodari, M, Pezzoli, F, Montalenti, F, Bonera, E, BARGET, MICHAEL REINER, SCOPECE, DANIELE, PEZZOLI, FABIO, MONTALENTI, FRANCESCO CIMBRO MATTIA, and BONERA, EMILIANO
- Published
- 2015
4. Local uniaxial tensile strain in germanium of up to 4% induced by SiGe epitaxial nanostructures
- Author
-
Bollani, M, Chrastina, D, Gagliano, L, Rossetto, L, Scopece, D, Barget, M, Mondiali, V, Frigerio, J, Lodari, M, Pezzoli, F, Montalenti, F, Bonera, E, SCOPECE, DANIELE, BARGET, MICHAEL REINER, PEZZOLI, FABIO, MONTALENTI, FRANCESCO CIMBRO MATTIA, BONERA, EMILIANO, Bollani, M, Chrastina, D, Gagliano, L, Rossetto, L, Scopece, D, Barget, M, Mondiali, V, Frigerio, J, Lodari, M, Pezzoli, F, Montalenti, F, Bonera, E, SCOPECE, DANIELE, BARGET, MICHAEL REINER, PEZZOLI, FABIO, MONTALENTI, FRANCESCO CIMBRO MATTIA, and BONERA, EMILIANO
- Abstract
We show that a relatively simple top-down fabrication can be used to locally deform germanium in order to achieve uniaxial tensile strain of up to 4%. Such high strain values are theoretically predicted to transform germanium from an indirect to a direct gap semiconductor. These values of strain were obtained by control of the perimetral forces exerted by epitaxial SiGe nanostructures acting as stressors. These highly strained regions can be used to control the band structure of silicon-integrated germanium epilayers.
- Published
- 2015
5. Local Uniaxial Tensile Deformation of Germanium up to the 4% Threshold by Epitaxial Nanostructures.
- Author
-
Gagliano, L, Rossetto, L, Scopece, D, Mondiali, V, Lodari, M, Barget, M, DE CESARI, S, Pezzoli, F, Bollani, M, Chrastina, D, Montalenti, F, Bonera, E, SCOPECE, DANIELE, BARGET, MICHAEL REINER, DE CESARI, SEBASTIANO, PEZZOLI, FABIO, MONTALENTI, FRANCESCO CIMBRO MATTIA, BONERA, EMILIANO, Gagliano, L, Rossetto, L, Scopece, D, Mondiali, V, Lodari, M, Barget, M, DE CESARI, S, Pezzoli, F, Bollani, M, Chrastina, D, Montalenti, F, Bonera, E, SCOPECE, DANIELE, BARGET, MICHAEL REINER, DE CESARI, SEBASTIANO, PEZZOLI, FABIO, MONTALENTI, FRANCESCO CIMBRO MATTIA, and BONERA, EMILIANO
- Published
- 2014
6. Straining Ge bulk and nanomembranes for optoelectronic applications: a systematic numerical analysis
- Author
-
Scopece, D, Montalenti, F, Bonera, E, Bollani, M, Chrastina, D, SCOPECE, DANIELE, MONTALENTI, FRANCESCO CIMBRO MATTIA, BONERA, EMILIANO, Chrastina, D., Scopece, D, Montalenti, F, Bonera, E, Bollani, M, Chrastina, D, SCOPECE, DANIELE, MONTALENTI, FRANCESCO CIMBRO MATTIA, BONERA, EMILIANO, and Chrastina, D.
- Abstract
Germanium is known to become a direct band gap material when subject to a biaxial tensile strain of 2% (Vogl et al 1993 Phys. Scr. T49B 476) or uniaxial tensile strain of 4% (Aldaghri et al 2012 J. Appl. Phys. 111 053106). This makes it appealing for the integration of optoelectronics into current CMOS technology. It is known that the induced strain is highly dependent on the geometry and composition of the whole system (stressors and substrate), leaving a large number of variables to the experimenters willing to realize this transition and just a trial-and-error procedure. The study in this paper aims at reducing this freedom. We adopt a finite element approach to systematically study the elastic strain induced by different configurations of lithographically-created SiGe nanostructures on a Ge substrate, by focusing on their composition and geometries. We numerically investigate the role played by the Ge substrate by comparing the strain induced on a bulk or on a suspended membrane. These results and their interpretation can provide the community starting guidelines to choose the appropriate subset of parameters to achieve the desired strain. A case of a very large optically active area of a Ge membrane is reported. © 2014 IOP Publishing Ltd.
- Published
- 2014
7. Self-organized evolution of Ge/Si(001) into intersecting bundles of horizontal nanowires during annealing
- Author
-
Zhang, J, Rastelli, A, Schmidt, O, Scopece, D, Miglio, L, Montalenti, F, Zhang, J, Rastelli, A, Schmidt, O, Scopece, D, Miglio, L, and Montalenti, F
- Abstract
We report the observation of large scale self-assembly of long horizontal nanowires into orthogonally oriented bundles, during in situ annealing of a few monolayers of Ge on Si(001). Results are interpreted in terms of a collective wave-propagation mechanism, previously suggested for interpreting ripple faceting on Ge/Si(1110) surfaces. Quantitative agreement between experiments and theory is found. The onset of the mechanism, the number of wires in the bundles, and their total density can be controlled by carefully tuning the growth parameters.
- Published
- 2013
8. One-dimensional Ge nanostructures on Si(001) and Si(1 1 10): Dominant role of surface energy
- Author
-
Montalenti, F, Scopece, D, Miglio, L, Montalenti, F, Scopece, D, and Miglio, L
- Abstract
Ge/Si(001) is a prototypical system for investigating three-dimensional island self-assembly owed to the Stranski-Krastanow growth mode. More than twenty years of research have produced an impressive amount of results, together with various theoretical interpretations. It is commonly believed that lattice-mismatch strain relief is the major driving force leading to the formation of these islands. However, a set of recent results on Si(001) and vicinals point out that, under suitable conditions, this is not the case. Indeed, we here review experimental and theoretical results dealing with nanostructures mainly determined by surface-energy minimization. Results are intriguing, as they reveal the existence of magic sizes, show the presence of very peculiar morphologies, such as micron-long wires, and distinguish among attempts to facet the wetting-layer and true SK islands.
- Published
- 2013
9. Stability of Ge on Si (1 1 10) surfaces and the role of dimer tilting
- Author
-
Scopece, D, Montalenti, F, Beck, M, SCOPECE, DANIELE, MONTALENTI, FRANCESCO CIMBRO MATTIA, Beck, MJ, Scopece, D, Montalenti, F, Beck, M, SCOPECE, DANIELE, MONTALENTI, FRANCESCO CIMBRO MATTIA, and Beck, MJ
- Published
- 2012
10. Surface and interface effects on the stability of SiGe nanoislands
- Author
-
Scopece, D, MIGLIO, LEONIDA, SCOPECE, DANIELE, Scopece, D, MIGLIO, LEONIDA, and SCOPECE, DANIELE
- Abstract
Deposition of Ge upon Si substrates is the prototype of the mechanism called Stranski- Krastanov growth, i.e. the self-assembled formation of 3D islands, following the formation of a thin, 2D Wetting Layer. As is shown in Chapter 1, the nucleation of these islands is random and non-uniform when the deposition is performed upon the standard Si(001) substrate. Deposition of SiGe on different substrates of Si can lead, however, to a high degree of uniformity. Some examples are described in Chapters 3 and 4. The aim of this thesis is to supply a quantitative analysis for some peculiar phenomena concerning island nucleation that occurs on these non-standard substrates. This is performed through the evaluation of the internal energy of the island (including also effects on the substrate) as discussed at length in Chapter 2, where the elastic, surface and edge energy contributions are described, focusing particular attention to the second one, that turns out to be quite complicated. Particular attention is devoted to the island nucleation on stepped substrates of Si (Chapter 4). An in-depth analysis of the formation of faceting upon the substrate Si(1 1 10) is carried out in Chapter 5, whereas Chapter 6 deals with the transition from the faceting to three-dimensional islands on this peculiar system. Conclusions are drawn in Chapter 7. Appendices A and B contain some additional information regarding the elastic field and the description of surfaces. In Appendix C an analysis of the strained surface energy is carried out. In Appendix D some preliminary work performed during the PhD period on other impor- tant surfaces for the SiGe system is discussed. Finally at page 203 a Curriculum Vitae is reported.
- Published
- 2012
11. One-Dimensional to Three-Dimensional Ripple-to-Dome Transition for SiGe on Vicinal Si(1 1 10)
- Author
-
Sanduijav, B, Scopece, D, Matei, D, Chen, G, Schaffler, F, Miglio, L, Springholz, G, SCOPECE, DANIELE, MIGLIO, LEONIDA, Springholz, G., Sanduijav, B, Scopece, D, Matei, D, Chen, G, Schaffler, F, Miglio, L, Springholz, G, SCOPECE, DANIELE, MIGLIO, LEONIDA, and Springholz, G.
- Abstract
SiGe heteroepitaxy on vicinal Si (1 1 10) is studied as a model system for one-dimensional (1D) to three-dimensional growth mode transitions. By in situ scanning tunneling microscopy it is shown that the 1D-3D transition proceeds smoothly from perfectly facetted 1D nanoripples to coarsened superripples, tadpoles, asymmetric domes, and barns without involving coalescence or agglomeration. By extension of the studies to a wide range of SiGe compositions, a 1D-3D growth phase diagram is obtained. Total energy calculations reveal that the observed critical transition volumes are fully consistent with thermodynamic driven strain relaxation.
- Published
- 2012
12. Monolithic Growth of Ultrathin Ge Nanowires on Si(001)
- Author
-
Zhang, J, Katsaros, G, Montalenti, F, Scopece, D, Rezaev, R, Mickel, C, Rellinghaus, B, Miglio, L, De Franceschi, S, Rastelli, A, Schmidt, O, Zhang, JJ, MONTALENTI, FRANCESCO CIMBRO MATTIA, SCOPECE, DANIELE, Rezaev, RO, MIGLIO, LEONIDA, Schmidt, OG, Zhang, J, Katsaros, G, Montalenti, F, Scopece, D, Rezaev, R, Mickel, C, Rellinghaus, B, Miglio, L, De Franceschi, S, Rastelli, A, Schmidt, O, Zhang, JJ, MONTALENTI, FRANCESCO CIMBRO MATTIA, SCOPECE, DANIELE, Rezaev, RO, MIGLIO, LEONIDA, and Schmidt, OG
- Abstract
Self-assembled Ge wires with a height of only 3 unit cells and a length of up to 2 micrometers were grown on Si(001) by means of a catalyst-free method based on molecular beam epitaxy. The wires grow horizontally along either the [100] or the [010] direction. On atomically flat surfaces, they exhibit a highly uniform, triangular cross section. A simple thermodynamic model accounts for the existence of a preferential base width for longitudinal expansion, in quantitative agreement with the experimental findings. Despite the absence of intentional doping, the first transistor-type devices made from single wires show low-resistive electrical contacts and single-hole transport at sub-Kelvin temperatures. In view of their exceptionally small and self-defined cross section, these Ge wires hold promise for the realization of hole systems with exotic properties and provide a new development route for silicon-based nanoelectronics.
- Published
- 2012
13. Formation of Ge Nanoripples on Vicinal Si (1110): From Stranski-Krastanow Seeds to a Perfectly Faceted Wetting Layer
- Author
-
Chen, G, Sanduijav, B, Matei, D, Springholz, G, Scopece, D, Beck, M, Montalenti, F, Miglio, L, SCOPECE, DANIELE, Beck, MJ, MONTALENTI, FRANCESCO CIMBRO MATTIA, MIGLIO, LEONIDA, Chen, G, Sanduijav, B, Matei, D, Springholz, G, Scopece, D, Beck, M, Montalenti, F, Miglio, L, SCOPECE, DANIELE, Beck, MJ, MONTALENTI, FRANCESCO CIMBRO MATTIA, and MIGLIO, LEONIDA
- Abstract
Ge growth on high-indexed Si (1110) is shown to result in the spontaneous formation of a perfectly {105} faceted one-dimensional nanoripple structure. This evolution differs from the usual Stranski-Krastanow growth mode because from initial ripple seeds a faceted Ge layer is formed that extends down to the heterointerface. Ab initio calculations reveal that ripple formation is mainly driven by lowering of surface energy rather than by elastic strain relief and the onset is governed by the edge energy of the ripple facets. Wavelike ripple replication is identified as an effective kinetic pathway for the transformation process.
- Published
- 2012
14. Collective Shape Oscillations of SiGe Islands on Pit-Patterned Si(001) Substrates: A Coherent-Growth Strategy Enabled by Self-Regulated Intermixing
- Author
-
Zhang, J, Montalenti, F, Rastelli, A, Hrauda, N, Scopece, D, Groiss, H, Stangl, J, Pezzoli, F, Schaffler, F, Schmidt, O, Miglio, L, Bauer, G, Zhang, JJ, Schmidt, OG, Bauer, G., MONTALENTI, FRANCESCO CIMBRO MATTIA, SCOPECE, DANIELE, PEZZOLI, FABIO, MIGLIO, LEONIDA, Zhang, J, Montalenti, F, Rastelli, A, Hrauda, N, Scopece, D, Groiss, H, Stangl, J, Pezzoli, F, Schaffler, F, Schmidt, O, Miglio, L, Bauer, G, Zhang, JJ, Schmidt, OG, Bauer, G., MONTALENTI, FRANCESCO CIMBRO MATTIA, SCOPECE, DANIELE, PEZZOLI, FABIO, and MIGLIO, LEONIDA
- Abstract
The shape of coherent SiGe islands epitaxially grown on pit-patterned Si(001) substrates displays very uniform collective oscillations with increasing Ge deposition, transforming cyclically between shallower "dome'' and steeper "barn'' morphologies. Correspondingly, the average Ge content in the alloyed islands also displays an oscillatory behavior, superimposed on a progressive Si enrichment with increasing size. We show that such a growth mode, remarkably different from the flat-substrate case, allows the islands to keep growing in size while avoiding plastic relaxation
- Published
- 2010
15. Self-organized evolution of Ge/Si(001) into intersecting bundles of horizontal nanowires during annealing
- Author
-
Zhang, J. J., primary, Rastelli, A., additional, Schmidt, O. G., additional, Scopece, D., additional, Miglio, L., additional, and Montalenti, F., additional
- Published
- 2013
- Full Text
- View/download PDF
16. Monolithic Growth of Ultrathin Ge Nanowires on Si(001)
- Author
-
Zhang, J. J., primary, Katsaros, G., additional, Montalenti, F., additional, Scopece, D., additional, Rezaev, R. O., additional, Mickel, C., additional, Rellinghaus, B., additional, Miglio, L., additional, De Franceschi, S., additional, Rastelli, A., additional, and Schmidt, O. G., additional
- Published
- 2012
- Full Text
- View/download PDF
17. One-Dimensional to Three-Dimensional Ripple-to-Dome Transition for SiGe on Vicinal Si (1 1 10)
- Author
-
Sanduijav, B., primary, Scopece, D., additional, Matei, D., additional, Chen, G., additional, Schäffler, F., additional, Miglio, L., additional, and Springholz, G., additional
- Published
- 2012
- Full Text
- View/download PDF
18. Formation of Ge Nanoripples on Vicinal Si (1110): From Stranski-Krastanow Seeds to a Perfectly Faceted Wetting Layer
- Author
-
Chen, G., primary, Sanduijav, B., additional, Matei, D., additional, Springholz, G., additional, Scopece, D., additional, Beck, M. J., additional, Montalenti, F., additional, and Miglio, L., additional
- Published
- 2012
- Full Text
- View/download PDF
19. Collective Shape Oscillations of SiGe Islands on Pit-Patterned Si(001) Substrates: A Coherent-Growth Strategy Enabled by Self-Regulated Intermixing
- Author
-
Zhang, J. J., primary, Montalenti, F., additional, Rastelli, A., additional, Hrauda, N., additional, Scopece, D., additional, Groiss, H., additional, Stangl, J., additional, Pezzoli, F., additional, Schäffler, F., additional, Schmidt, O. G., additional, Miglio, L., additional, and Bauer, G., additional
- Published
- 2010
- Full Text
- View/download PDF
20. Local uniaxial tensile strain in germanium of up to 4% induced by SiGe epitaxial nanostructures
- Author
-
Luca Gagliano, Daniel Chrastina, Fabio Pezzoli, Jacopo Frigerio, Monica Bollani, Mario Lodari, Emiliano Bonera, Lidia Rossetto, Michael Barget, Francesco Montalenti, Valeria Mondiali, Daniele Scopece, Bollani, M, Chrastina, D, Gagliano, L, Rossetto, L, Scopece, D, Barget, M, Mondiali, V, Frigerio, J, Lodari, M, Pezzoli, F, Montalenti, F, and Bonera, E
- Subjects
Materials science ,Fabrication ,Physics and Astronomy (miscellaneous) ,Strain (chemistry) ,Germanium ,business.industry ,phonons ,nanofabrications ,chemistry.chemical_element ,Nanotechnology ,Epitaxy ,Germanium, Elemental semiconductors, Nanofabrication, Phonons, Elasticity ,Semiconductor ,FIS/01 - FISICA SPERIMENTALE ,chemistry ,Ultimate tensile strength ,elasticity ,elemental semiconductors ,Deformation (engineering) ,Composite material ,Electronic band structure ,business - Abstract
We show that a relatively simple top-down fabrication can be used to locally deform germanium in order to achieve uniaxial tensile strain of up to 4%. Such high strain values are theoretically predicted to transform germanium from an indirect to a direct gap semiconductor. These values of strain were obtained by control of the perimetral forces exerted by epitaxial SiGe nanostructures acting as stressors. These highly strained regions can be used to control the band structure of silicon-integrated germanium epilayers. (C) 2015 AIP Publishing LLC.
- Published
- 2015
- Full Text
- View/download PDF
21. Straining Ge bulk and nanomembranes for optoelectronic applications: a systematic numerical analysis
- Author
-
Monica Bollani, Daniel Chrastina, Emiliano Bonera, Daniele Scopece, Francesco Montalenti, Scopece, D, Montalenti, F, Bonera, E, Bollani, M, and Chrastina, D
- Subjects
Finite element method ,Silicon ,Nanostructure ,SiGe ,Band gap ,Biaxial tensile strain ,chemistry.chemical_element ,Germanium ,Substrate (electronics) ,Uniaxial tensile strain ,SiGe nanostructure ,Materials Chemistry ,Electrical and Electronic Engineering ,CMOS integrated circuit ,Tensile strain ,Optoelectronic ,business.industry ,Finite-element approach ,Numerical analysis ,Membrane ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,chemistry ,Optoelectronics ,Direct and indirect band gaps ,business - Abstract
Germanium is known to become a direct band gap material when subject to a biaxial tensile strain of 2% (Vogl et al 1993 Phys. Scr. T49B 476) or uniaxial tensile strain of 4% (Aldaghri et al 2012 J. Appl. Phys. 111 053106). This makes it appealing for the integration of optoelectronics into current CMOS technology. It is known that the induced strain is highly dependent on the geometry and composition of the whole system (stressors and substrate), leaving a large number of variables to the experimenters willing to realize this transition and just a trial-and-error procedure. The study in this paper aims at reducing this freedom. We adopt a finite element approach to systematically study the elastic strain induced by different configurations of lithographically-created SiGe nanostructures on a Ge substrate, by focusing on their composition and geometries. We numerically investigate the role played by the Ge substrate by comparing the strain induced on a bulk or on a suspended membrane. These results and their interpretation can provide the community starting guidelines to choose the appropriate subset of parameters to achieve the desired strain. A case of a very large optically active area of a Ge membrane is reported. © 2014 IOP Publishing Ltd.
- Published
- 2014
22. One-dimensional Ge nanostructures on Si(001) and Si(1 1 10): Dominant role of surface energy
- Author
-
Leo Miglio, Daniele Scopece, Francesco Montalenti, Montalenti, F, Scopece, D, and Miglio, L
- Subjects
Materials science ,Nanostructure ,Ge ,Condensed matter physics ,General Engineering ,strain relaxation ,Energy Engineering and Power Technology ,Nanotechnology ,Strain relief ,Surface energy ,surface energy ,Self-assembly ,Si ,Facet ,FIS/03 - FISICA DELLA MATERIA - Abstract
Ge/Si(001) is a prototypical system for investigating three-dimensional island self-assembly owed to the Stranski–Krastanow growth mode. More than twenty years of research have produced an impressive amount of results, together with various theoretical interpretations. It is commonly believed that lattice-mismatch strain relief is the major driving force leading to the formation of these islands. However, a set of recent results on Si(001) and vicinals point out that, under suitable conditions, this is not the case. Indeed, we here review experimental and theoretical results dealing with nanostructures mainly determined by surface-energy minimization. Results are intriguing, as they reveal the existence of magic sizes, show the presence of very peculiar morphologies, such as micron-long wires, and distinguish among attempts to facet the wetting-layer and true SK islands.
- Published
- 2013
23. Monolithic growth of ultra-thin Ge nanowires on Si(001)
- Author
-
Daniele Scopece, Bernd Rellinghaus, Jian-Jun Zhang, Oliver G. Schmidt, Armando Rastelli, C. Mickel, Francesco Montalenti, R. O. Rezaev, Georgios Katsaros, Leo Miglio, S. De Franceschi, Zhang, J, Katsaros, G, Montalenti, F, Scopece, D, Rezaev, R, Mickel, C, Rellinghaus, B, Miglio, L, De Franceschi, S, Rastelli, A, and Schmidt, O
- Subjects
Materials science ,Nanostructure ,Silicon ,Nanowire ,General Physics and Astronomy ,chemistry.chemical_element ,FOS: Physical sciences ,Nanotechnology ,02 engineering and technology ,Growth ,01 natural sciences ,Cross section (physics) ,0103 physical sciences ,Mesoscale and Nanoscale Physics (cond-mat.mes-hall) ,010306 general physics ,FIS/03 - FISICA DELLA MATERIA ,Condensed Matter - Materials Science ,Condensed Matter - Mesoscale and Nanoscale Physics ,business.industry ,Doping ,Materials Science (cond-mat.mtrl-sci) ,021001 nanoscience & nanotechnology ,Electrical contacts ,Heteroepitaxy ,chemistry ,Nanoelectronics ,Optoelectronics ,Self-assembly ,Ge/Si ,0210 nano-technology ,business ,Molecular beam epitaxy - Abstract
Self-assembled Ge wires with a height of only 3 unit cells and a length of up to 2 micrometers were grown on Si(001) by means of a catalyst-free method based on molecular beam epitaxy. The wires grow horizontally along either the [100] or the [010] direction. On atomically flat surfaces, they exhibit a highly uniform, triangular cross section. A simple thermodynamic model accounts for the existence of a preferential base width for longitudinal expansion, in quantitative agreement with the experimental findings. Despite the absence of intentional doping, first transistor-type devices made from single wires show low-resistive electrical contacts and single hole transport at sub-Kelvin temperatures. In view of their exceptionally small and self-defined cross section, these Ge wires hold promise for the realization of hole systems with exotic properties and provide a new development route for silicon-based nanoelectronics., 23 pages, 5 figures
- Published
- 2012
24. Stability of Ge on Si (1 1 10) surfaces and the role of dimer tilting
- Author
-
Francesco Montalenti, Matthew J. Beck, Daniele Scopece, Scopece, D, Montalenti, F, and Beck, M
- Subjects
Surface (mathematics) ,Materials science ,Dimer ,1 1 10 ,Stability (probability) ,Molecular physics ,Overlayer ,epilayer thickne ,chemistry.chemical_compound ,strain ,dimer tilting ,FIS/03 - FISICA DELLA MATERIA ,Strain (chemistry) ,double step Db ,Condensed Matter Physics ,multiscale modeling ,Surface energy ,heteroepitaxy ,Electronic, Optical and Magnetic Materials ,Faceting ,chemistry ,surface energy ,Density functional theory ,vicinal surface - Abstract
Using both density functional theory--local density approximation and Tersoff potentials, we calculate (1 1 10), (105), and (001) surface energies relevant to the self-assembly of Ge ${$105$}$ ripples on Si (1 1 10) substrates. Surface energies are calculated as a function of Ge overlayer thickness and applied strain. Comparison of density functional theory (DFT) and Tersoff potential results reveals qualitative differences in the predicted dependence of surface energies on Ge overlayer thickness and the stability of the Ge on Si (1 1 10) surface relative to the Ge on Si (001) surface. DFT calculations show that ${\ensuremath{\gamma}}_{\text{Ge}/\text{Si}}^{(1110)}$ is strongly influenced by the presence of tilted dimers, and provide an explanation for the differing stability predictions. Finally, a multiscale model including strain- and thickness-dependent ${\ensuremath{\gamma}}_{\text{Ge}/\text{Si}}$ is used to show that surface energy is a driving force for formation of Ge {105} ripples on Si (1 1 10), supporting recent experimental results of Ge-deposition-induced ${$105$}$ faceting on Si (1 1 10).
- Published
- 2012
- Full Text
- View/download PDF
25. Surface and interface effects on the stability of SiGe nanoislands
- Author
-
SCOPECE, DANIELE, Scopece, D, and MIGLIO, LEONIDA
- Subjects
heteroepitaxy, germanium, silicon, multiscale modeling, finite element method, elastic energy, surface energy, tersoff, density functional theory, wulff solid, edge energy, islands ,FIS/03 - FISICA DELLA MATERIA - Abstract
Deposition of Ge upon Si substrates is the prototype of the mechanism called Stranski- Krastanov growth, i.e. the self-assembled formation of 3D islands, following the formation of a thin, 2D Wetting Layer. As is shown in Chapter 1, the nucleation of these islands is random and non-uniform when the deposition is performed upon the standard Si(001) substrate. Deposition of SiGe on different substrates of Si can lead, however, to a high degree of uniformity. Some examples are described in Chapters 3 and 4. The aim of this thesis is to supply a quantitative analysis for some peculiar phenomena concerning island nucleation that occurs on these non-standard substrates. This is performed through the evaluation of the internal energy of the island (including also effects on the substrate) as discussed at length in Chapter 2, where the elastic, surface and edge energy contributions are described, focusing particular attention to the second one, that turns out to be quite complicated. Particular attention is devoted to the island nucleation on stepped substrates of Si (Chapter 4). An in-depth analysis of the formation of faceting upon the substrate Si(1 1 10) is carried out in Chapter 5, whereas Chapter 6 deals with the transition from the faceting to three-dimensional islands on this peculiar system. Conclusions are drawn in Chapter 7. Appendices A and B contain some additional information regarding the elastic field and the description of surfaces. In Appendix C an analysis of the strained surface energy is carried out. In Appendix D some preliminary work performed during the PhD period on other impor- tant surfaces for the SiGe system is discussed. Finally at page 203 a Curriculum Vitae is reported.
- Published
- 2012
26. Collective Shape Oscillations of SiGe Islands on Pit-Patterned Si(001) Substrates: A Coherent-Growth Strategy Enabled by Self-Regulated Intermixing
- Author
-
Fabio Pezzoli, Leo Miglio, J. J. Zhang, Armando Rastelli, G. Bauer, Heiko Groiss, Daniele Scopece, Friedrich Schäffler, Francesco Montalenti, N. Hrauda, J. Stangl, Oliver G. Schmidt, Zhang, J, Montalenti, F, Rastelli, A, Hrauda, N, Scopece, D, Groiss, H, Stangl, J, Pezzoli, F, Schaffler, F, Schmidt, O, Miglio, L, and Bauer, G
- Subjects
Dome (geology) ,Materials science ,Optics ,Condensed matter physics ,business.industry ,Relaxation (NMR) ,General Physics and Astronomy ,Epitaxy ,business ,Deposition (law) ,Si,Ge,islands,elastic relaxation, intermixing, molecular beam epitaxy ,FIS/03 - FISICA DELLA MATERIA - Abstract
The shape of coherent SiGe islands epitaxially grown on pit-patterned Si(001) substrates displays very uniform collective oscillations with increasing Ge deposition, transforming cyclically between shallower "dome'' and steeper "barn'' morphologies. Correspondingly, the average Ge content in the alloyed islands also displays an oscillatory behavior, superimposed on a progressive Si enrichment with increasing size. We show that such a growth mode, remarkably different from the flat-substrate case, allows the islands to keep growing in size while avoiding plastic relaxation
- Published
- 2010
27. Mapping the Structure of Oxygen-Doped Wurtzite Aluminum Nitride Coatings from Ab Initio Random Structure Search and Experiments.
- Author
-
Gasparotto P, Fischer M, Scopece D, Liedke MO, Butterling M, Wagner A, Yildirim O, Trant M, Passerone D, Hug HJ, and Pignedoli CA
- Abstract
Machine learning is changing how we design and interpret experiments in materials science. In this work, we show how unsupervised learning, combined with ab initio random structure searching, improves our understanding of structural metastability in multicomponent alloys. We focus on the case of Al-O-N alloys where the formation of aluminum vacancies in wurtzite AlN upon the incorporation of substitutional oxygen can be seen as a general mechanism of solids where crystal symmetry is reduced to stabilize defects. The ideal AlN wurtzite crystal structure occupation cannot be matched due to the presence of an aliovalent hetero-element into the structure. The traditional interpretation of the c -lattice shrinkage in sputter-deposited Al-O-N films from X-ray diffraction (XRD) experiments suggests the existence of a solubility limit at 8 at % oxygen content. Here, we show that such naive interpretation is misleading. We support XRD data with accurate ab initio modeling and dimensionality reduction on advanced structural descriptors to map structure-property relationships. No signs of a possible solubility limit are found. Instead, the presence of a wide range of non-equilibrium oxygen-rich defective structures emerging at increasing oxygen contents suggests that the formation of grain boundaries is the most plausible mechanism responsible for the lattice shrinkage measured in Al-O-N sputtered films. We further confirm our hypothesis using positron annihilation lifetime spectroscopy.
- Published
- 2021
- Full Text
- View/download PDF
28. Silicon etch with chromium ions generated by a filtered or non-filtered cathodic arc discharge.
- Author
-
Scopece D, Döbeli M, Passerone D, Maeder X, Neels A, Widrig B, Dommann A, Müller U, and Ramm J
- Abstract
The pre-treatment of substrate surfaces prior to deposition is important for the adhesion of physical vapour deposition coatings. This work investigates Si surfaces after the bombardment by energetic Cr ions which are created in cathodic arc discharges. The effect of the pre-treatment is analysed by X-ray diffraction, Rutherford backscattering spectroscopy, scanning electron microscopy and in-depth X-ray photoemission spectroscopy and compared for Cr vapour produced from a filtered and non-filtered cathodic arc discharge. Cr coverage as a function of ion energy was also predicted by TRIDYN Monte Carlo calculations. Discrepancies between measured and simulated values in the transition regime between layer growth and surface removal can be explained by the chemical reactions between Cr ions and the Si substrate or between the substrate surface and the residual gases. Simulations help to find optimum and more stable parameters for specific film and substrate combinations faster than trial-and-error procedure.
- Published
- 2016
- Full Text
- View/download PDF
Catalog
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.