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Vanadium doped diamond-like carbon films prepared by unbalanced magnetron sputtering have been investigated by X-ray and ultraviolet photoelectron spectroscopy measurements for the purpose of revealing electronic structures including values of work function on the surfaces. In addition to these photoelectron measurements, X-ray diffraction measurements have been performed to characterize the crystal structures.

The resonant inelastic x-ray scattering (RIXS) was measured in an insulating SrCuO$_{2}$ with changing the incident photon energy ($h\nu$) near the Cu $1s$ absorption edge (K-edge). Complex structures and their dependences on the momentum transfer($\Delta k$) and $h\nu$ were observed. The $h\nu$ dependence of the RIXS spectra measured for a constant $\Delta k$=2.4$\pi$ has shown a remarkable enhancement near the absorption maximum and a shift of the spectral weight toward larger loss-energy with increasing $h\nu$. Also, the energy of the inelastic loss peak in the RIXS spectra for the fixed excitation at 8.993 keV, 10 eV below the absorption maximum, has shown a clear dependence on $\Delta k$. These results are in a qualitative agreement with a theoretical prediction. Full utilization of the potential of the high brilliance X ray light source at BL19LXU of SPring-8 with 27 m long insertion device will open up a breakthrough in RIXS for heavy transition metal compounds in accordance with the improvement in focussing and analyzing elements., Comment: 7 pages, 5 figures, jpsj2.cls