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The future Athena observatory will feature optics with unprecedented collecting area enabled by silicon pore optics technology. In order to achieve the telescope effective area requirements at 1 keV and 7 keV, thin film coatings of iridium with a low-density overcoat are deposited onto the mirror substrates. Assembling the coated silicon pore optics plates into mirror modules for the Athena optics requires wet chemical processing and thermal annealing. While iridium appears to be compatible with the post-coating processes, previous studies have shown degradation of the low-density material. The overcoat layer is particularly critical for the low-energy telescope performance, so several candidate materials (boron carbide, silicon carbide and carbon) have been studied to identify a compatible thin film design. We present the characterisation of x-ray mirror performance using x-ray reflectometry, as well as the measurements of residual film stress with stylus profilometry. Furthermore, we evaluate the effects of post-coating treatment in order to recommend the most suitable overcoat material for the telescope.

The thin film deposition technology for fabrication of the mirror optics for the Advanced Telescope for HighEnergy Astrophysics (ATHENA) has been established. Numerous coating process parameters impact the quality of the thin films. Defining a margin within the coating process parameter space, where the deposited thin film performs similar in X-ray reflectivity is key to avoid unforeseen risks within the coating process for the ATHENA flight optics production. In this work, we investigate the coating process parameter influence on the thin film properties with a focus on micro roughness, deposition rate and residual film stress when deposited under various process conditions. The thin films were produced by varying the following three coating process parameters: discharge power, discharge voltage and working gas pressure. The thin films were characterized using X–ray reflectometry at 3.4–10.0 keV. A main result of this work is that the residual stress of single layer iridium and boron carbide films can be reduced by a factor of approximately two, by increasing the working gas pressure while maintaining a high film quality.

The thin film coating technology for the European Space Agency mission, Advanced Telescope for High-Energy Astrophysics (Athena) has been established. The X-ray optics of the Athena telescope is based on Silicon Pore Optics (SPO) technology which is enhanced by the thin film coatings deposited on the reflective surface of the SPO plates. In this work, we present a literature study of the coating process parameter space and provide an overview of the thin film properties with a focus on micro roughness, chemical composition and wear resistance when deposited under various process conditions. We determined, that the thin film density depends strongly on the mobility of the adatoms on the substrate surface. Some coating process parameters, which have a significant impact on the adatom mobility are the discharge voltage, the working gas pressure and the substrate temperature.

The development of high-quality thin film coatings for the Athena X-ray optics is progressing, following the commissioning of an industrial scale coating facility. The assembly of silicon pore optics into mirror modules for the Athena telescope requires wet-chemical exposure of coated mirror plates to prepare bonding areas for stacking, as well as an annealing step to improve bond strength. It is therefore critical to evaluate how these post-coating processes could affect the mirror coating performance and stability. We present X-ray reflectometry characterization of iridium thin films deposited on photoresist patterned Silicon Pore Optics plates to investigate the compatibility with the stacking process steps for the manufacturing of the Athena optics.

As part of the manufacturing process of mirror modules for the Athena X-ray telescope, Silicon Pore Optics plates are assembled into mirror module stacks. The plates that form each stack are held together by direct bonding, relying on van der Waals forces and covalent bonds for adhesion. One way to increase the strength of the covalent bonds is through annealing of the mirror stacks. It is of critical importance to the mission to ensure compatibility between the reflective coating and any post-coating processing of the plates. We present our findings of the impact of annealing on the X-ray re ectance of coated mirrors relevant for the Athena mission. These are Ir single layers, as well as Ir/B4C, Ir/SiC, and Ir/C bilayers. We investigate the effect on the performance of the coatings after annealing at atmospheric pressure and at a low vacuum using X-ray reflectometry. B4C is found to suffer degradation from annealing under atmospheric conditions but not when annealed in vacuum. All other materials investigated are robust to atmospheric annealing.

The Advanced Telescope for High ENergy Astrophysics (Athena) is a Cosmic Vision L-class mission of the European Space Agency selected for launch in the early 2030s1. The observatory features a single X-ray telescope with a 12 m focal length. The focusing Wolter-I optics is based on Silicon Pore Optics (SPO) technology2. The Athena science objectives require a high performance in the 0.3-12 keV range which is obtained with X-ray reflective thin films.

We present an experimental examination of iridium and boron carbide thin-film coatings for the purpose of fabricating x-ray optics. We use a combination of x-ray reflectometry and x-ray photoelectron spectroscopy to model the structure, composition, density, thickness, and micro-roughness of the thin films. We demonstrate in our analyses how the two characterization techniques are complementary, and from this we derive that an overlayer originating from atmospheric contamination with a thickness between 1.0–1.6 nm is present on the surface. The magnetron sputtered iridium films are measured to have a density of 22.4g/cm3. The boron carbide film exhibits a change in chemical composition in the top ∼2nm of the film surface when exposed to the ambient atmosphere. The chemical reaction occurring on the surface is due to an incorporation of oxygen and hydrogen present in the ambient atmosphere. Lastly, we present a correlation between the absorption edges and the emission lines exhibited by the thin films in an energy range from 50–800 eV and the impact on the reflectivity performance due to contamination in thin films.

As part of the thin film development for the Athena X-ray telescope and X-ray optics in general, we investigated the residual stress in iridium and chromium thin films deposited using direct current magnetron sputtering. Residual stresses in thin films can affect the performance and adhesion properties of the fabricated thin film coated X-ray optics. We characterized the thin films using X-ray reflectometry to determine the thin film thicknesses and stylus profilometry to determine the residual film stresses. To counterbalance the compressive stress identified in the iridium thin films, we introduced a chromium thin film layer for which the residual stress is tensile beneath the iridium film. However, chromium thin films are known to exhibit a grainy growth resulting in a high surface roughness which was also observed in this work. In this paper, we evaluated the effect on the iridium surface roughness when introducing a chromium underlayer and discussed the effect on the X-ray optics performance.

The demand for X-ray optics increases and so do their performance requirements. Iridium (Ir) thin film coatings have proven to be very robust and exhibit excellent reflective properties within the X-ray regime. However, the residual stress in Ir thin films is high and studies show that thin film Ir coatings with a thickness of 10–30 nm exhibit residual compressive stress1 as illustrated in Figure 1.

With a number of upcoming spaceborne and ground-based observatories equipped with X-ray telescopes that rely on high throughput at low energies, it is crucial to characterize these optics at the relevant energies to obtain a detailed understanding of their behavior and performance. DTU Space has commissioned a state-of-the-art Low-Energy X-ray Reflectometer (LEXR) with the purpose of studying thin-film performance of especially low-Z X-ray coatings.

A state-of-the-art Low-Energy X-ray Reflectometer (LEXR) is in operation at DTU Space with the main purpose of characterizing coatings for the Advanced Telescope for High-ENergy Astrophysics (ATHENA), a selected Lclass ESA mission. In particular, soft materials are difficult to characterize at higher energies so the 1.487 keV beamline compliments our existing 8.048 keV reflectometer, allowing for a more complete understanding of thinfilm X-ray characteristics. Documenting and qualifying the as-deposited coatings for X-ray telescope optics is of crucial importance, both to ensure that the effective area requirements are met, but also to quantify any temporal evolution in coating characteristics as well as the impact of manufacturing process parameters on mirror performance. It is notably relevant in the case of ATHENA, as there is a desire to enhance the low-energy performance by using a low-Z material overcoating on top of the Ir coating. We report on the commissioning and qualify the performance of the as-built 1.487 keV reflectometer as well as discuss measurement repeatability and system limitations

X-ray reflectivity (XRR) characterization of X-ray mirrors is an essential step for designing space telescopes and instruments. We report on production and characterization of platinum thin films coated onto a at thick glass substrate for evaluating measurement results obtained using several XRR systems. The main objective of this study is to compare the XRR results measured using facilities at the Technical University of Denmark, DTU Space, and BESSY II for the Advanced Telescope for High-ENergy Astrophysics (ATHENA) mission funded by the European Space Agency, ESA. This sample will be used as a reference sample for testing and calibrating similar measurements at relevant X-ray facilities. This information demonstrates the stable performance of the platinum mirror as a reference sample. Also, the overlayer effect on mirror performance is investigated.

Qualification of coating performance at the low-energy range of the Advanced Telescope for High Energy Astrophysics (ATHENA) is important to ensure that the mirror coatings satisfy the performance criteria required to meet ATHENA's science objectives. We report on the design, implementation, and expected performance of a state-of-the-art Low-Energy X-ray Reflectometer (LEXR) acquired with the purpose of qualifying the soft energy X-ray performance of mirror coatings for ATHENA. The reflectometer components are housed in a vacuum chamber and utilizes a microfocus Al source with custom made Kirkpatrick-Baez mirrors and W/Si monochromator to produce a collimated beam of 1.487 keV photons. The system has been designed with source interchangeability, allowing reconfiguration to an 8.048 keV reflectometer using a Cu source or other energies with sources such as Fe, Mg, etc. Several mirror samples can be mounted on a motorized stage, and a 2D CCD camera is used to obtain spatially resolved detection.

Excellent X-ray reflective mirror coatings are key in order to meet the performance requirements of the ATHENA telescope. The baseline coating design of ATHENA was initially formed by Ir/B4C but extensive studies have identified critical issues with the stability of the B4C top layer which shows strong evolution over time and appears incompatible with the industrialization processes required for the production of mirror modules. Motivated by the need for a compatible top layer material to improve the telescope performance at low energies and based on simulated performance, a SiC top layer has been selected as the best substitute to B4C. We report the latest development of Ir/SiC bilayer coatings optimized for ATHENA and the characterization of coating performance and stability.

We present a ray tracing simulation of the Soft X-ray Imager (SXI) optics for the THESEUS observatory using the open-source McXtrace software package. THESEUS is a candidate mission within the Cosmic Vision programme of the European Space Agency and is designed to monitor high-energy transient events in the entire sky, therefore relying on fast slewing of the spacecraft. This capability will however impose large temperature variations and gradients across the optics which can cause thermoelastic deformation of the Soft X-ray Imager microchannel optics. The purpose of this study is to evaluate the impact on the point spread function (PSF) due to in-orbit temperature variation. Based on thermal analysis of the Soft X-ray Imager, perturbations to the ideal microchannel geometry are derived and provided as input to the ray tracer.

The ATHENA (Advanced Telescope for High Energy Astrophysics) X-ray observatory is an ESA-selected L2 class mission. In the proposed configuration, the optical assembly has a diameter of 2.2 m with an effective area of 1.4 m2 at 1 keV, 0.25 m2 at 6 keV, and requires an angular resolution of 5 arcsec. To meet the requirements of effective area and angular resolution, the technology of Silicon Pore Optics (SPO) was selected for the optics implementation. The ATHENA's optic assembly requires hundreds of SPOs mirror modules (MMs), obtained by stacking wedged and ribbed silicon wafer plates onto silicon mandrels to form the Wolter-I configuration. Different factors can contribute to limit the imaging performances of SPOs, such as i) diffraction through the pore apertures, ii) plate deformations due to fabrication errors and surface roughness, iii) alignment errors among plates in an MM, and iv) co-focality errors within the MMs assembly. In order to determine the fabrication and assembling tolerances, the impact of these contributions needs to be assessed prior to manufacturing. A set of simulation tools responding to this need was developed in the framework of the ESA-financed projects SIMPOSIuM and ASPHEA. In this paper, we present the performance simulation obtained for the recently proposed ATHENA configuration in terms of effective area, and we provide a simulation of the diffractive effects in a pair of SPO MMs. Finally, we present an updated sizing of magnetic diverter (a Halbach array) and the magnetic fields levels that can be reached in order to deviate the most energetic protons out of the detector field.

The ATHENA X-ray observatory is a large-class ESA approved mission, with launch scheduled in 2028. The technology of silicon pore optics (SPO) was selected as baseline to assemble ATHENA’s optic with hundreds of mirror modules, obtained by stacking wedged and ribbed silicon wafer plates onto silicon mandrels to form the Wolter-I configuration. In the current configuration, the optical assembly has a 3 m diameter and a 2 m2 effective area at 1 keV, with a required angular resolution of 5 arcsec. The angular resolution that can be achieved is chiefly the combination of 1) the focal spot size determined by the pore diffraction, 2) the focus degradation caused by surface and profile errors, 3) the aberrations introduced by the misalignments between primary and secondary segments, 4) imperfections in the co-focality of the mirror modules in the optical assembly. A detailed simulation of these aspects is required in order to assess the fabrication and alignment tolerances; moreover, the achievable effective area and angular resolution depend on the mirror module design. Therefore, guaranteeing these optical performances requires: a fast design tool to find the most performing solution in terms of mirror module geometry and population, and an accurate point spread function simulation from local metrology and positioning information. In this paper, we present the results of simulations in the framework of ESA-financed projects (SIMPOSiuM, ASPHEA, SPIRIT), in preparation of the ATHENA X-ray telescope, analyzing the mentioned points: 1) we deal with a detailed description of diffractive effects in an SPO mirror module, 2) we show ray-tracing results including surface and profile defects of the reflective surfaces, 3) we assess the effective area and angular resolution degradation caused by alignment errors between SPO mirror module’s segments, and 4) we simulate the effects of co-focality errors in X-rays and in the UV optical bench used to study the mirror module alignme

In the frame of the development of the Advanced Telescope for High-ENergy Astrophysics (Athena) mission, currently in phase A, ESA is continuing to mature the optics technology and the associated mass production techniques. These efforts are driven by the programmatic and technical requirement of reaching TRL 6 prior to proposing the mission for formal adoption (planned for 2020). A critical part of the current phase A preparation activities is addressing the industrialization of the Silicon Pore Optics mirror plates coating. This include the transfer of the well-established coating processes and techniques, performed at DTU Space, to an industrial scale facility suitable for coating the more than 100,000 mirror plates required for Athena. In this paper, we explain the considerations for the planned coating facility including, requirement specification, equipment and supplier selection, preparing the coating facility for the deposition equipment, designing and fabrication.

A gamma-ray detector composed of a single 28×28×20 mm3 LaBr3:Ce crystal coupled to a custom built 4×4 array of silicon photomultipliers was tested over an energy range of 30 keV to 9.3 MeV. The silicon photomultipliers were initially calibrated using 20 ns light pulses generated by a light emitting diode. The photodetector responses measured as a function of the number of incident photons were found to be non-linear and consistent with model predictions. Using corrections for the non-linearity of the silicon photomultipliers, the detector showed a linear response to gamma-rays with energies from 100 keV to the maximum available energy of 9.3 MeV. The energy resolution was found to be 4% FWHM at 662 keV. Despite the large thickness of the scintillator (20 mm) and a 5 mm thick optical window, the detector was capable of measuring the positions of the gamma-ray interaction points. The position resolution was measured at 356 keV and was found to be 8 mm FWHM in the detector plane and 11 mm FWHM for the depth of interaction. The detector can be used as a building block of a larger calorimeter system that is capable of measuring gamma-ray energies up to tens of MeV.