1. Versatile AFM setup combined with micro-focused X-ray beam
- Author
-
Slobodskyy, T., Zozulya, A. V., Tholapi, R., Liefeith, L., Fester, M., Sprung, M., and Hansen, W.
- Subjects
Physics - Instrumentation and Detectors ,Condensed Matter - Materials Science - Abstract
Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure and performance of the setup are presented., Comment: To be submitted to Review of Scientific Instruments
- Published
- 2015