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1. Design and characterization of high-voltage 4H-SiC p-IGBTs

2. Performance and stability of large-area 4H-SiC 10-kV junction barrier Schottky rectifiers

8. Structure of Carrot Defects in 4H-SiC Epilayers

11. Techniques for Minimizing the Basal Plane Dislocation Density in SiC Epilayers to Reduce Vf Drift in SiC Bipolar Power Devices

14. Development of Epitaxial SiC Processes Suitable for Bipolar Power Devices

16. Dislocation Characterization in 4H-SiC Crystals

18. Bulk Growth of Large Area SiC Crystals

19. Defect Status in SiC Manufacturing

20. SiC Epitaxial Growth on Multiple 100-mm Wafers and its Application to Power-Switching Devices

22. A 13 kV 4H-SiC n-Channel IGBT with Low Rdiff,on and Fast Switching

24. Critical Technical Issues in High Voltage SiC Power Devices

26. Design and Characterization of High-Voltage 4H-SiC p-IGBTs

31. Large Diameter 4H-SiC Substrates for Commercial Power Applications

39. Performance of Low-Dark-Current 4H-SiC Avalanche Photodiodes With Thin Multiplication Layer.

40. A 13 kV 4H-SiC n-Channel IGBT with Low Rdiff,on and Fast Switching

41. Development of Large Area (up to 1.5 cm2) 4H-SiC 10 kV Junction Barrier Schottky Rectifiers

42. Techniques for Minimizing the Basal Plane Dislocation Density in SiC Epilayers to Reduce Vf Drift in SiC Bipolar Power Devices

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