13 results on '"Svechnikov, Mikhail"'
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2. Matrix based algorithm for ion-beam figuring of optical elements
3. BornAgain, software for GISAS and reflectometry: Releases 1.17 to 20
4. Intrinsic roughness and interfaces of Cr/Be multilayers
5. Optical constants of beryllium thin layers determined from Mo/Be multilayers in spectral range 90 to 134 eV
6. Reflecting properties of narrowband Si/Al/Sc multilayer mirrors at 58.4 nm
7. Matched characterization of super-multiperiod superlattices
8. Multifitting: software for the reflectometric reconstruction of multilayer nanofilms
9. Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV
10. Beryllium-Based Multilayer Mirrors and Filters for the Extreme Ultraviolet Range
11. Beryllium-based multilayer X-ray optics
12. Stable high-reflection Be/Mg multilayer mirrors for solar astronomy at 304 nm
13. High-reflection Mo/Be/Si multilayers for EUV lithography
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