Search

This work reports an unconventional defect engineering approach using synchrotron‐radiation‐based X‐rays on ceria nanocrystal catalysts of particle sizes 4.4–10.6 nm. The generation of a large number of oxygen‐vacancy defects (OVDs), and therefore an effective reduction of cations, has been found in CeO2 catalytic materials bombarded by high‐intensity synchrotron X‐ray beams of beam size 1.5 mm × 0.5 mm, photon energies of 5.5–7.8 keV and photon fluxes up to 1.53 × 1012 photons s−1. The experimentally observed cation reduction was theoretically explained by a first‐principles formation‐energy calculation for oxygen vacancy defects. The results clearly indicate that OVD formation is mainly a result of X‐ray‐excited core holes that give rise to valence holes through electron down conversion in the material. Thermal annealing and subvalent Y‐doping were also employed to modulate the efficiency of oxygen escape, providing extra control on the X‐ray‐induced OVD generating process. Both the core‐hole‐dominated bond breaking and oxygen escape mechanisms play pivotal roles for efficient OVD formation. This X‐ray irradiation approach, as an alternative defect engineering method, can be applied to a wide variety of nanostructured materials for physical‐property modification. [ABSTRACT FROM AUTHOR]

Ultraviolet (UV) light irradiation on CeO2 nanocrystals catalysts has been observed to largely increase the material's catalytic activity and reactive surface area. As revealed by x-ray absorption near edge structure (XANES) analysis, the concentration of subvalent Ce3+ ions in the irradiated ceria samples progressively increases with the UV-light exposure time. The increase of Ce3+ concentration as a result of UV irradiation was also confirmed by the UV-vis diffuse reflectance and photoluminescence spectra that indicate substantially increased concentration of oxygen vacancy defects in irradiated samples. First-principle formation-energy calculation for oxygen vacancy defects revealed a valence-hole-dominated mechanism for the irradiation-induced reduction of CeO2 consistent with the experimental results. Based on a Mars-van Krevelen mechanism for ceria catalyzed oxidation processes, as the Ce3+ concentration is increased by UV-light irradiation, an increased number of reactive oxygen atoms will be captured from gas-phase O2 by the surface Ce3+ ions, and therefore leads to the observed catalytic activity enhancement. The unique annealing-free defect engineering method using UV-light irradiation provides an ultraconvenient approach for activity improvement in nanocrystal ceria for a wide variety of catalytic applications. [ABSTRACT FROM AUTHOR]

This work reports an unconventional defect engineering approach using synchrotron-radiation-based X-rays on ceria nanocrystal catalysts of particle sizes 4.4-10.6 nm. The generation of a large number of oxygen-vacancy defects (OVDs), and therefore an effective reduction of cations, has been found in CeO 2 catalytic materials bombarded by high-intensity synchrotron X-ray beams of beam size 1.5 mm × 0.5 mm, photon energies of 5.5-7.8 keV and photon fluxes up to 1.53 × 10 12 photons s -1 . The experimentally observed cation reduction was theoretically explained by a first-principles formation-energy calculation for oxygen vacancy defects. The results clearly indicate that OVD formation is mainly a result of X-ray-excited core holes that give rise to valence holes through electron down conversion in the material. Thermal annealing and subvalent Y-doping were also employed to modulate the efficiency of oxygen escape, providing extra control on the X-ray-induced OVD generating process. Both the core-hole-dominated bond breaking and oxygen escape mechanisms play pivotal roles for efficient OVD formation. This X-ray irradiation approach, as an alternative defect engineering method, can be applied to a wide variety of nanostructured materials for physical-property modification.