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842 results on '"Takayanagi, K."'

3. Electron microscopy of the strain on the Si(111)$7\times7$ surface induced by the STM tip

Author

Naitoh, Y., Takayanagi, K., Ohshima, Y., and Hirayama, H.

Subjects
Condensed Matter - Materials Science
Abstract

The Si(111)7x7 surface was observed by reflection electron microscopy (REM) and scanning tunneling microscopy (STM) simultaneously in an ultra-high vacuum electron microscope. The distance between the STM tip and the Si surface was detected from the REM image, which showed the real and the mirror image of the tip. We approached the tip to the surface or retracted from the surface by a piezo drive to observe the strain induced on the Si(111)7x7 surface as a function of the tip-surface distance. This investigation was done with and without the bias voltage between the tip and the substrate. With bias voltage of 1.0 V on the sample, the tip was approached to 1.6 nm above the sample surface for the tunneling current of 0.8 nA, no detectable order of strain (10^{-4}) was induced on the sample surface. When the bias decreased within the range of -0.3 - +0.5 V, the surface was compressed over the Si surface area of 100 nm. Without the bias voltage, tensile and compressive strain was detected as the tip-surface distance changed from attractive to the repulsive interaction regime. The strain field extended over 50 - 140 nm, and the force became neutral at the tip-substrate distance of 0.45 nm., Comment: 8 pages, RevTex, 8 figures

Published
2001

4. Equivalence of Local and Separable Realizations of the Discontinuity-Inducing Contact Interaction and Its Perturbative Renormalizability

Author

Cheon, Taksu, Shigehara, T., and Takayanagi, K.

Subjects
Quantum Physics, Condensed Matter, Nonlinear Sciences - Exactly Solvable and Integrable Systems, Nuclear Theory
Abstract

We prove that the separable and local approximations of the discontinuity-inducing zero-range interaction in one-dimensional quantum mechanics are equivalent. We further show that the interaction allows the perturbative treatment through the coupling renormalization. Keywords: one-dimensional system, generalized contact interaction, renormalization, perturbative expansion. PACS Nos: 3.65.-w, 11.10.Gh, 31.15.Md, Comment: ReVTeX 7pgs, doubl column, no figure, See also the website http://www.mech.kochi-tech.ac.jp/cheon/

Published
1998
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30. Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy.

Author

Harumoto, T., Sannomiya, T., Matsukawa, Y., Muraishi, S., Shi, J., Nakamura, Y., Sawada, H., Tanaka, T., Tanishiro, Y., and Takayanagi, K.

Subjects
ALUMINUM nitride, METALS, SCANNING transmission electron microscopy, EPITAXY, INTERFACES (Physical sciences)
Abstract

The polarity determination process of sputter-deposited aluminum nitride (AlN) on metals has been analyzed using aberration corrected atomic resolution scanning transmission electron microscope. Direct growth of c-axis orientated AlN on face centered cubic metals (fcc) (111) with the local epitaxy has been observed, and the polarity was determined at the AlN/metal interface. We found that the AlN polarity can be controlled by the base metal layer: N-polarity AlN grows on Pt(111) while Al-polarity AlN forms on Al(111). Based on these results, the growth mechanism of AlN on metals is discussed. [ABSTRACT FROM AUTHOR]

Published
2013
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39. A low inductance metal-in-gap head using a side-core concept

Author

Sano, A., Egawa, M., Nitta, M., Takayanagi, K., Matsushita, T., Fujita, T., Packard, E., Nguyen, V., Limb, R., Frost, J., and Watanabe, T.

Subjects
Magnetic recorders and recording -- Heads, Disk drives -- Equipment and supplies, Magnetic induction (Electromagnetic induction) -- Analysis, Business, Electronics, Electronics and electrical industries
Abstract

A low inductance metal-in-gap(MIG) head for rigid disk drives using a single crystal ferrite core was developed. Side mounting philosophy of a core was adopted to reduce the thickness of the core, thus improving the inductance, and to achieve the ease of controlling the narrow track width and small throat height. It was demonstrated that the 'side-core composite(SCC)' head has several advantages over conventional monolithic and composite heads in terms of electrical performance and manufacturability. New type of testing methods named 'swept frequency' and 'swept current' were also developed to demonstrate different interpretations of magnetic recording phenomena.

Published
1993

40. Determination of Aberration Center of Ronchigram for Automated Aberration-Corrected Scanning Transmission Electron Microscopy

Author

Sannomiya, Takumi, Sawada, H., Nakamichi, T., Hosokawa, F., Nakamura, Y., Tanishiro, Y., and Takayanagi, K

Subjects
Physics, Optics, Fitness function, Contrast transfer function, Transmission electron microscopy, business.industry, Aperture, Scanning transmission electron microscopy, Center (algebra and category theory), business, Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
Abstract

A generic method to determine the aberration center is established, which can be utilized for aberration calculation and axis alignment for aberration corrected electron microscopes. In this method, decentering induced secondary aberrations from inherent primary aberrations are minimized to find the appropriate axis center. The fitness function to find the optimal decentering vector for the axis was defined as a sum of decentering induced secondary aberrations with properly distributed weight values according to the aberration order. Since the appropriate decentering vector is determined from the aberration values calculated at an arbitrary center axis, only one aberration measurement is in principle required to find the center, resulting in /very fast center search. This approach was tested for the Ronchigram based aberration calculation method for aberration corrected scanning transmission electron microscopy. Both in simulation and in experiments, the center search was confirmed to work well although the convergence to find the best axis becomes slower with larger primary aberrations. Such aberration center determination is expected to fully automatize the aberration correction procedures, which used to require pre-alignment of experienced users. This approach is also applicable to automated aperture positioning.

Published
2013

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