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A SiNO film increases the cross-talk value of a recordable compact disk with AgO(x). Numerical values of pit shapes exhibit a linear correlationship with electrical properties of the disk. Disk with SiNO film satisfies the orange book standards. Pit formation model explains the relation between electrical properties and various dielectric films.

Phase change random access memory devices have evolved dramatically with the recent development of superlattice structure of Ge-Sb-Te material (GST-SL) in terms of its low power consumption. The phase change in GST-SL is mainly characterized by the displacement of Ge atoms. Here we examine a new phase change method, that is the manipulation of Ge-Te bonds using linearly-polarized femtosecond near-infrared optical pulses. As a result, we found that the p-polarized pump pulse is more effective in inducing the reversible and irreversible displacement of Ge atoms along [111] direction in the local structure. This structural change would be induced by the anisotropic carrier-phonon interaction along the [111] direction created by the p-polarized pulse.

GeTe is an end-point of the GeTe-Sb2Te3 quasibinary alloys often referred to as phase-change memory materials. The polycrystalline nature of the crystalline films used in devices and the concomitant presence of grain boundaries complicate detailed structural studies of the local structure. Recent progress in the epitaxial growth of phase-change materials offers unique possibilities for precise structural investigations. In this work, we report on results of x-ray absorption near-edge structure (XANES) studies of GeTe and GeTe and Ge2Sb2Te5 epitaxial films grown on Si and InAs substrates with (100) and (111) orientations. The results show a strong dependence of the local structure on the substrate material and especially orientation and are discussed in conjunction with polycrystalline samples and ab-initio XANES simulations. [ABSTRACT FROM AUTHOR]

In this article, we report on ZnO nanowires that were phosphorus doped using a spin on dopant glass deposition and diffusion method. Photoluminescence measurements suggest that this process yields p-doped ZnO. The spatial location of P atoms was studied using x-ray near-edge absorption structure spectroscopy and it is concluded that the doping is amphoteric with P atoms located on both Zn and O sites. [ABSTRACT FROM AUTHOR]

A gradual uncontrollable increase in the resistivity of the amorphous phase of phase-change alloys, such as Ge2Sb2Te5, known as drift, is a serious technological issue for application of phase-change memory. While it has been proposed that drift is related to structural relaxation, no direct structural results have been reported so far. Here, we report the results of Ge L3-edge x-ray absorption measurements that suggest that the drift in electrical conductivity is associated with the gradual conversion of tetrahedrally coordinated Ge sites into pyramidal sites, while the system still remains in the amorphous phase. Based on electronic configuration arguments, we propose that during this process, which is governed by the existence of lone-pair electrons, the concentration of free carriers in the system decreases resulting in an increase in resistance despite the structural relaxation towards the crystalline phase. [ABSTRACT FROM AUTHOR]

Results of x-ray absorption studies of the structure of amorphous InSb are reported. We demonstrate that approximately 1% bond elongation in the amorphous phase (as compared to the crystalline phase) is accompanied by a counterintuitive increase (approximately 5%) in density. We argue that this controversy is due to the formation of wrong bonds in the amorphous phase with both Sb and In atoms effectively preserving their tetrahedral coordination. Our results additionally offer an alternative interpretation of the semiconductor-metal transition observed upon melting of InSb. [ABSTRACT FROM AUTHOR]