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It is now generally accepted that Euclidean-based metrics may not always adequately represent the subjective judgement of a human observer. As a result, many image processing methodologies have been recently extended to take advantage of alternative visual quality measures, the most prominent of which is the Structural Similarity Index Measure (SSIM). The superiority of the latter over Euclidean-based metrics have been demonstrated in several studies. However, being focused on specific applications, the findings of such studies often lack generality which, if otherwise acknowledged, could have provided a useful guidance for further development of SSIM-based image processing algorithms. Accordingly, instead of focusing on a particular image processing task, in this paper, we introduce a general framework that encompasses a wide range of imaging applications in which the SSIM can be employed as a fidelity measure. Subsequently, we show how the framework can be used to cast some standard as well as original imaging tasks into optimization problems, followed by a discussion of a number of novel numerical strategies for their solution.

In this paper, we study a mixed variational problem subject to perturbations, where the noise term is modelled by means of a bilinear form that has to be understood to be "small" in some sense. Indeed, we consider a family of such problems and provide a result that guarantees existence and uniqueness of the solution. Moreover, a stability condition for the solutions yields a Generalized Collage Theorem, which extends previous results by the same authors. We introduce the corresponding Galerkin method and study its convergence. We also analyze the associated inverse problem and we show how to solve it by means of the mentioned Generalized Collage Theorem and the use of adequate Schauder bases. Numerical examples show how the method works in a practical context.

Understanding the coupling of graphene with its local environment is critical to be able to integrate it in tomorrow's electronic devices. Here we show how the presence of a metallic substrate affects the properties of an atomically tailored graphene layer. We have deliberately introduced single carbon vacancies on a graphene monolayer grown on a Pt(111) surface and investigated its impact in the electronic, structural and magnetic properties of the graphene layer. Our low temperature scanning tunneling microscopy studies, complemented by density functional theory, show the existence of a broad electronic resonance above the Fermi energy associated with the vacancies. Vacancy sites become reactive leading to an increase of the coupling between the graphene layer and the metal substrate at these points; this gives rise to a rapid decay of the localized state and the quenching of the magnetic moment associated with carbon vacancies in free-standing graphene layers.

Several methods are currently available to simulate paths of the Brownian motion. In particular, paths of the BM can be simulated using the properties of the increments of the process like in the Euler scheme, or as the limit of a random walk or via L2 decomposition like the Kac-Siegert/Karnounen-Loeve series. In this paper we first propose a IFSM (Iterated Function Systems with Maps) operator whose fixed point is the trajectory of the BM. We then use this representation of the process to simulate its trajectories. The resulting simulated trajectories are self-affine, continuous and fractal by construction. This fact produces more realistic trajectories than other schemes in the sense that their geometry is closer to the one of the true BM's trajectories. The IFSM trajectory of the BM can then be used to generate more realistic solutions of stochastic differential equations.