87 results on '"Trujillo-Sevilla, Juan M."'
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2. Ultra-High Resolution Optical Aberrometry in Patients with Keratoconus: A Cross-Sectional Study
3. 3D Shape Measurements of Patterned Silicon Wafers
4. Influence of angle Kappa on the optimal intraocular orientation of asymmetric multifocal intraocular lenses
5. New technique for measuring free-form wafer shape for feed-forward overlay corrections
6. Clinical applicability of the WaveFront Phase Imaging Sensor in the Keratoconus Disease
7. The optics of the human eye at 8.6 µm resolution
8. New optical metrology technique for measuring the shape of a lithography photo mask
9. New patterned silicon wafer shape metrology system
10. Real-Time Wavefront Sensing at High Resolution with an Electrically Tunable Lens
11. New metrology technique for measuring the free shape of a patterned 300mm wafer held vertically
12. Repeatability study of silicon wafer shape measurements
13. New wafer shape measurement technique for 300mm blank vertically held silicon wafer
14. Comment on: Keratopigmentation; a comprehensive review
15. New technique for measuring free-form wafer shape to enable wafer distortion predictions
16. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers
17. New patterned silicon wafer shape metrology system
18. New wavefront phase sensor used for 3D shape measurements of silicon wafers
19. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers
20. Wave front phase imaging for silicon wafer metrology
21. A Theoretical Method for Removal of Gravity-Induced Effects in Silicon Wafer Geometry Measurements
22. New wafer shape measurement technique for 300mm blank vertically held silicon wafers
23. New metrology technique for measuring patterned wafer geometry on a full 300mm wafer
24. Wavefront phase measurement of striae in optical glass
25. Wafer Geometry Technique for Blank 300mm Silicon Wafers
26. A two-layers automultiscopic display as a resistant device to shoulder-surfing attacks
27. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
28. Stereo occlusion enhancement by the use of semantic information and monocular depth estimation
29. New metrology technique for measuring the free shape of a patterned 300mm wafer held vertically
30. A two-layers automultiscopic display as a resistant device to shoulder-surfing attacks.
31. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
32. New wafer shape measurement technique for 300mm blank vertically held silicon wafer
33. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers
34. New wavefront phase sensor used for 3D shape measurements of silicon wafers
35. The optics of the human eye at 8.6 µm lateral resolution
36. Comment on: Keratopigmentation; a comprehensive review
37. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers.
38. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
39. Stria measurement using wave front phase imaging on a transparent plate
40. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
41. New technique for measuring free-form wafer shape to enable wafer distortion predictions.
42. Weighted nonnegative tensor factorization for atmospheric tomography reconstruction
43. Calibration method applied to a tunable tensor display system.
44. New patterned silicon wafer shape metrology system.
45. New wafer shape measurement technique for 300mm blank vertically held silicon wafers.
46. Focus measurement in 3D focal stack using direct and inverse discrete radon transform
47. New high-resolution wave ophthalmic instrument for the characterizing ocular optics
48. Privacy-enabled displays.
49. Lightfield super-resolution through turbulence
50. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers.
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