15 results on '"Ulanova, Anastasia V."'
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2. A simple analytical model of single-event upsets in bulk CMOS
3. Comparative analysis of tolerance to space ionizing radiation for ReRAM and other non-volatile memory types
4. The influence of high ionizing dose rate on CMOS IC radiation hardness used in da-ta transmission elements
5. Hardness assurance levels and requirements for single event effects testing of integrated circuits
6. Microdose effects in SRAM cells under heavy ion irradiation
7. Automated measurement system for optoelectronic devices based on National Instruments PXI-platform
8. Influence of FRAM operational mode on its SEE susceptibility
9. Hardware/software solution for optocouplers with output MOSFET transistors based on National Instruments PXI-platform
10. Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM
11. Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation
12. Design of 65 nm CMOS SRAM for Space Applications: A Comparative Study
13. Infrared focal plane array FPA320×256 radiation hardness investigation
14. Design of 65 nm CMOS SRAM for space applications: A comparative study
15. Verification of SRAM MСUs calculation technique for experiment time optimization
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