1. Surface excitations in liquid helium nanofilms
- Author
-
I. V. Kalinin, A. V. Puchkov, Michael Marek Koza, V. V. Lauter-Pasyuk, and Hans J. Lauter
- Subjects
Materials science ,Spectrometer ,Condensed matter physics ,Liquid helium ,Neutron diffraction ,chemistry.chemical_element ,Film temperature ,General Chemistry ,Inelastic scattering ,Condensed Matter Physics ,Inelastic neutron scattering ,law.invention ,chemistry ,law ,General Materials Science ,Atomic physics ,Excitation ,Helium - Abstract
The structural dynamic factor S(Q, ω) of liquid 4He has been measured by inelastic neutron scattering in films of different thickness at temperatures from 0.6 to 0.05 K. The measurements were performed on an IN6 spectrometer (Institut Laue-Langevin, France). Analysis of the obtained experimental data on S(Q, ω) made it possible to establish the main parameters of surface excitations arising in a helium film and their dependences on the film temperature and thickness. The measurements showed that surface excitations arise in a helium film at a thickness of about two to three atomic layers, and the film thickness plays a decisive role in the formation of surface excitations.
- Published
- 2007