514 results on '"Van Overstraeten, R."'
Search Results
2. Transmission electron microscopy of Si3N4/SiO2 structures for local oxidation processes
3. Summary and conclusions
4. Transistors
5. Band structure and optical properties
6. Strained layer optoelectronic devices
7. Strain relaxation and defects
8. Electrical and magnetic properties
9. Strain and critical thickness
10. Characterization and growth
11. Introduction
12. Validation of a New Method of Measuring Esophageal Acid Exposure: Comparison with 24-Hour pH Monitoring
13. III-nitrides: Growths, characterization, and properties
14. Dislocations in GaN/Sapphire: Their Distribution and Effect on Stress and Optical Properties
15. Measurement of Nonuniform Stresses in Semiconductors by the Micro-Raman Method
16. Impact of the transmission line properties of a metal-ultrathin silicon dioxide-semiconductor field-effect transistor on the extracted inversion-layer thickness
17. Trends in industrial silicon solar cell processes
18. Compound Semiconductors Strained Layers and Devices
19. Energy of arrays of nonperiodic interacting dislocations in semiconductor strained epilayers: implications for strain relaxation
20. Carrier Transport in Bulk Silicon and in Weak Silicon Inversion Layers
21. PROGRESS OF PHOTOVOLTAIC SOLAR ENERGY DEVELOPMENT IN EUROPE
22. Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon
23. Advances in Silicon Solar Cell Processing
24. Passivation of Grain Boundaries in Polycrystalline Solar Cells
25. The Influence of Surface Conditions on the Open Circuit Voltage of Silicon Solar Cells
26. Polycrystalline Silicon Solar Cells Utilizing an Integral Screen Printing Technique
27. Limitations of the Open Circuit Voltage of Induced Junction Silicon Solar Cells Due to Surface Recombination
28. Validity of the Effective Lifetime Concept in Polycrystalline Silicon
29. PV Activities of the European Community
30. A method to interpret micro-Raman experiments made to measure nonuniform stresses: Application to...
31. Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers.
32. Theory of the junction capacitance of an abrupt diode.
33. The ''inhibition effect'' of a trichloroethane oxidation to suppress the stacking-fault nucleation in silicon.
34. High-temperature H2 anneal of interface defects in electron-beam-irradiated MNOS structures.
35. Theory of isothermal dielectric relaxation and direct determination of trap parameters.
36. Role of trap states in the insulator region for MIM characteristics.
37. Comparison of theoretical and experimental values of the capacitance of diffused junctions.
38. Analytical Expressions for Electric Field and for Capacitances of Symmetrical and Asymmetrical Abrupt p-n Junctions.
39. Review Paper on Silicon Solar Cells
40. Influence of the Double Exponential on the Efficiency and the Yield Of Screen Printed Solar Cells
41. Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon
42. Experimental Optimization of the Efficiency of n+ pp+ and p+ nn+ Silicon Solar Cells
43. Impurity Profile of Implanted Ions in Silicon
44. Bandgap Narrowing Due to Heavy Doping in Si1-xGex Layers
45. Effects of Grain Boundaries and Intragrain Defects in Silicon for Photovoltaic Applications
46. Dependence of the Propagation Delay of an ECL Gate on the Transistor and Circuit Parameters
47. Improvement of the Efficiency of Silicon MIS-Inversion Layer Solar Cells
48. The Photovoltaic Project of the Commission of the European Communities
49. Stress relaxation in laterally small strained semiconductor epilayers.
50. Discussion of the surface-potential fluctuations caused by oxide-charge fluctuations.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.