22 results on '"Vigar, David"'
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2. Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd
3. Trigger-When-Charged: A Technique for Directly Measuring RTN and BTI-Induced Threshold Voltage Fluctuation Under Use- ${V}_{dd}$
4. Effect of Spacer Scaling on PMOS Transistors
5. Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation
6. Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging
7. Addressable test structures for MOSFET variability analysis
8. Effect of Spacer Scaling on PMOS Transistors
9. Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
10. An Improved Shift-and-Ratio Effective Channel Length Extraction Method for Metal Oxide Silicon Transistors with Halo/Pocket Implants
11. Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
12. Effect of Spacer Scaling on PMOS Transistors.
13. Impact of boron penetration on gate oxide reliability and device performance in a dual-gate oxide process.
14. Importance of oxide capping on the suppression of dopant outdiffusion for salicide block process.
15. Analysis of N-channel transistor punch-through related to STI process.
16. Analysis of N-channel transistor punch-through related to STI process
17. Importance of oxide capping on the suppression of dopant outdiffusion for salicide block process
18. Colleges call for pick and mix choice
19. Controversy flourishes in Sir Ron's domain
20. Labour pledges 'windfall' for jobless learners
21. Wanted: qualified, acronym-free jargon junker.
22. Scientific advice for policymakers on climate change: the role of evidence synthesis.
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