1. COMPARISON OF INTERFACE AND STRUCTURE IN <font>NiO</font>-PINNING SPIN VALVES
- Author
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Liang Sun, Wei Zhang, Biao You, Hu Anhong, A. M. Zhang, Ming-Hui Lu, Shiming Zhou, Y. Ren, Jun Du, W. T. Sheng, and Z. R. Chen
- Subjects
Roughness effect ,Materials science ,Condensed matter physics ,business.industry ,Non-blocking I/O ,Spin valve ,Statistical and Nonlinear Physics ,Surface finish ,Condensed Matter Physics ,Optics ,Specular reflection ,business ,Layer (electronics) ,Deposition (law) ,Spin-½ - Abstract
Top and bottom NiO -pinning spin valves, e.g. Ta/NiO/Co/Cu/Co/Ta and Ta/Co/Cu/Co/NiO/Ta multilayers, were investigated extensively. At the same thickness of the Cu layer, the GMR ratio for the bottom one is about 30% larger than that for the top one, which is unambiguously due to the roughness effect at the NiO/Co interface. The roughness of NiO/Co interface of the top NiO -pinning spin valve is much larger than that of the bottom one, which may be due to the deposition sequence. On the other hand, although the preferred orientation of the top NiO -pinning spin valve is more prominent than that of the bottom one, it seems not favorable to the specular reflection effect.
- Published
- 2005