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1. Non-parametric Monitoring of Spatial Dependence

3. The Mollified (Discrete) Uniform Distribution and its Applications

4. Tobit models for count time series

5. Semi-parametric goodness-of-fit testing for INAR models

6. Mean-preserving rounding integer-valued ARMA models

7. Stein EWMA Control Charts for Count Processes

10. Generalized Moment Estimators based on Stein Identities

12. Control Charts for Poisson Counts based on the Stein-Chen Identity

15. Multiplicative Error Models for Count Time Series

24. Penalized estimation of flexible hidden Markov models for time series of counts

28. Ordinal compositional data and time series.

30. Weighted discrete ARMA models for categorical time series.

31. Generalized ordinal patterns in discrete-valued time series: nonparametric testing for serial dependence.

32. Soft-clipping INGARCH models for time series of bounded counts.

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