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With the advancement and reform of the science and technology, calculation and analysis method of base line project cost are constantly changing, gradually formed a large data analysis based management model. Because of the overhead line engineering construction point spread, wide construction cost index, involving in different stages of the project and big lost of the value cost index, it is difficult to carry out the accumulation of basic data. Facing the different forms and types of basic data, how to classify the integration of existing data and form an engineering cost information platform for the construction of the query and utilization of all parties has become an important issue. Based on the case inference technology of artificial intelligence, this paper establishes the engineering cost index prediction model of the completed engineering case inference system and overhead transmission line. Has completed the project cost information to make use of computer storage, statistics, analysis and dynamic query, such as scientific management, to realize the whole process of construction projects for overhead transmission lines, omnidirectional, the whole team cost control. It is of great significance to study the cost of overhead line engineering.

In order to improve the quality of life-cycle-cost of the transmission line system, this paper introduces the basic theory of the life-cycle-cost, analyse the construction of the lifecycle-cost of transmission line. Then two main parameters, the design life of transmission line and project fund discount rate, will be researched detailedly. At last, by giving the life-cycle-cost prediction model for those main parts of transmission line and providing the life-cycle-cost calculation model of transmission line, this paper proposes a design method for transmission line based on life-cycle-cost theory. The feasibility and effectivity of this design method for the transmission line could be proved by an example.

Reflection configured digital holographic microscopy (DHM) can perform accurate optical topography measurements of reflecting objects, such as MEMs, MOEMs, and semiconductor wafer. It can provide non-destructive quantitative measurements of surface roughness and geometric pattern characterization with nanometric axial resolution in real-time. However, the measurement results may be affected by an additional phase curvature introduced by the microscope objective (MO) used in DHM. It needs to be removed either by numerical compensation or by physical compensation. We present a method of physical spherical phase compensation for reflection DHM in the Michelson configuration. In the object arm, collimated light is used for illumination. Due to the use of the MO, the object wavefront may have a spherical phase curvature. In the reference arm, a lens and mirror combination is used to generate a spherical recording reference wave in order to physically compensate the spherical phase curvature of the object wavefront. By controlling the position of the mirror and the sample stage, the compensation process has been demonstrated. The relative positions of the test specimen and the reference mirror must be fixed for the physical spherical phase to be totally compensated. A numerical plane reference wave is preferred for the numerical reconstruction of the phase introduced by the test specimen. Experimental results on wafer pattern recognition are also given.

Common-path Digital Holographic Microscopy (CP-DHM) is a new technique which can physically compensate the phase curvature introduced by the microscope objective. We designed a compact CP-DHM system for quantitative phase measurement of transparant microscopic samples. The system incorporates a special fiber-connected condenser system which makes adjustment easy when using different microscope objectives. We present the results for the system calibration and analysis of a micro-lens array to demonstrate the performance of the system.

Zernike polynomials have been widely used to fit wavefront and, by their representation, calculate the deviation due to wavefront aberrations in an optical system. In order to obtain the coefficients of the Zernike polynomials, a set of discrete orthogonal polynomials needs to be constructed using the Gram-Schmidt method on a unitary circle, and the coefficients are then calculated by fitting the wavefront data and orthogonal polynomials by the least squares method. Through simulation, it is found there is a large deviation between the given coefficients and the calculated results because of limitations of the least squares method. This paper proposes a modified method to improve the accuracy of wavefront fitting.